Invention Application
- Patent Title: METHODS AND SYSTEMS FOR AUTOMATIC CLUSTERING OF DEFECT REPORTS
- Patent Title (中): 自动聚类缺陷报告的方法与系统
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Application No.: PCT/US2010021763Application Date: 2010-01-22
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Publication No.: WO2010085620A3Publication Date: 2010-11-04
- Inventor: RUS VASILE , SHIVA SAJJAN
- Applicant: UNIV MEMPHIS RES FOUNDATION , RUS VASILE , SHIVA SAJJAN
- Assignee: UNIV MEMPHIS RES FOUNDATION,RUS VASILE,SHIVA SAJJAN
- Current Assignee: UNIV MEMPHIS RES FOUNDATION,RUS VASILE,SHIVA SAJJAN
- Priority: US35903209 2009-01-23
- Main IPC: G06F11/08
- IPC: G06F11/08 ; G06F15/16 ; G06F17/00
Abstract:
One embodiment of the invention provides a method of grouping defects. The method includes the steps of obtaining a plurality of defect reports, preprocessing the defect reports, and applying a clustering algorithm, thereby grouping the defect reports. Another embodiment of the invention provides a computer-readable medium whose contents cause a computer to perform a method comprising: obtaining a plurality of defect reports; preprocessing the defect reports; and applying a clustering algorithm, thereby grouping the defect reports. Another aspect of the invention provides a system for grouping defect reports. The system includes: a preprocessing module, a representation module in communication with the preprocessing module, and a clustering module in communication with representation module.
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