Invention Application
- Patent Title: METHOD AND APPARATUS FOR MEASURING TEMPERATURE
- Patent Title (中): 测量温度的方法和装置
-
Application No.: PCT/GB2010/001865Application Date: 2010-10-06
-
Publication No.: WO2011045558A1Publication Date: 2011-04-21
- Inventor: OXLEY, Christopher Hunter , HOPPER, Richard Henry
- Applicant: DE MONTFORT UNIVERSITY , OXLEY, Christopher Hunter , HOPPER, Richard Henry
- Applicant Address: Innovation Centre Oxford Street Leicester LE1 5XY GB
- Assignee: DE MONTFORT UNIVERSITY,OXLEY, Christopher Hunter,HOPPER, Richard Henry
- Current Assignee: DE MONTFORT UNIVERSITY,OXLEY, Christopher Hunter,HOPPER, Richard Henry
- Current Assignee Address: Innovation Centre Oxford Street Leicester LE1 5XY GB
- Agency: SERJEANTS
- Priority: GB0917825.2 20091013
- Main IPC: G01K11/12
- IPC: G01K11/12 ; G01K11/20 ; G01J5/60
Abstract:
A method for measuring the temperature of a first material (10) comprises measuring a temperature-related characteristic of a microparticle of a second material (12) in thermal contact with the first material (10) and calculating the temperature of the first material (10) using the measured temperature-related characteristic of the microparticle of the second material (12). The microparticle of the second material (12) can be located on a surface (10a) of the first material (10) in point thermal contact with the surface (10a), thus enabling the measurement of the surface temperature of the first material (10) at the point of contact. An apparatus (14) for measuring the surface temperature of the first material (10) is also described.
Information query
