Invention Application
WO2011137071A3 METHODS AND APPARATUS FOR CALIBRATING FLOW CONTROLLERS IN SUBSTRATE PROCESSING SYSTEMS
审中-公开
用于在基板处理系统中校准流量控制器的方法和装置
- Patent Title: METHODS AND APPARATUS FOR CALIBRATING FLOW CONTROLLERS IN SUBSTRATE PROCESSING SYSTEMS
- Patent Title (中): 用于在基板处理系统中校准流量控制器的方法和装置
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Application No.: PCT/US2011033780Application Date: 2011-04-25
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Publication No.: WO2011137071A3Publication Date: 2012-03-01
- Inventor: CRUSE JAMES P , LANE JOHN W , GREGOR MARIUSCH , BUCKIUS DUC , DARAN BERRIN , COBB CORIE LYNN , XU MING , NGUYEN ANDREW
- Applicant: APPLIED MATERIALS INC , CRUSE JAMES P , LANE JOHN W , GREGOR MARIUSCH , BUCKIUS DUC , DARAN BERRIN , COBB CORIE LYNN , XU MING , NGUYEN ANDREW
- Assignee: APPLIED MATERIALS INC,CRUSE JAMES P,LANE JOHN W,GREGOR MARIUSCH,BUCKIUS DUC,DARAN BERRIN,COBB CORIE LYNN,XU MING,NGUYEN ANDREW
- Current Assignee: APPLIED MATERIALS INC,CRUSE JAMES P,LANE JOHN W,GREGOR MARIUSCH,BUCKIUS DUC,DARAN BERRIN,COBB CORIE LYNN,XU MING,NGUYEN ANDREW
- Priority: US33005610 2010-04-30
- Main IPC: H01L21/3065
- IPC: H01L21/3065 ; H01L21/66
Abstract:
Methods and apparatus for calibrating a plurality of gas flows in a substrate processing system are provided herein. In some embodiments, a substrate processing system may include a cluster tool comprising a first process chamber and a second process chamber coupled to a central vacuum transfer chamber; a first flow controller to provide a process gas to the first process chamber; a second flow controller to provide the process gas to the second process chamber; a mass flow verifier to verify a flow rate from each of the first and second flow controllers; a first conduit to selectively couple the first flow controller to the mass flow verifier; and a second conduit to selectively couple the second flow controller to the mass flow verifier.
Information query
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