Invention Application
- Patent Title: BACKSCATTER SYSTEM WITH VARIABLE SIZE OF DETECTOR ARRAY
- Patent Title (中): 具有可变尺寸的检测器阵列的后排系统
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Application No.: PCT/US2012/033585Application Date: 2012-04-13
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Publication No.: WO2012142456A2Publication Date: 2012-10-18
- Inventor: SCHUBERT, Jeffrey, R. , CASON, William, Randall
- Applicant: AMERICAN SCIENCE AND ENGINEERING, INC. , SCHUBERT, Jeffrey, R. , CASON, William, Randall
- Applicant Address: 829 Middlesex Turnpike Billerica, MA 01821 US
- Assignee: AMERICAN SCIENCE AND ENGINEERING, INC.,SCHUBERT, Jeffrey, R.,CASON, William, Randall
- Current Assignee: AMERICAN SCIENCE AND ENGINEERING, INC.,SCHUBERT, Jeffrey, R.,CASON, William, Randall
- Current Assignee Address: 829 Middlesex Turnpike Billerica, MA 01821 US
- Agency: SUNSTEIN, Bruce, D. et al.
- Priority: US61/475,994 20110415
- Main IPC: G01N23/203
- IPC: G01N23/203 ; G01V5/02
Abstract:
A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
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