Invention Application
WO2014077986A1 OPTICAL PUSH-PULL INTERFEROMETRIC SENSORS FOR ELECTROMAGNETIC SENSING
审中-公开
用于电磁感应的光学推拉式干涉式传感器
- Patent Title: OPTICAL PUSH-PULL INTERFEROMETRIC SENSORS FOR ELECTROMAGNETIC SENSING
- Patent Title (中): 用于电磁感应的光学推拉式干涉式传感器
-
Application No.: PCT/US2013/064122Application Date: 2013-10-09
-
Publication No.: WO2014077986A1Publication Date: 2014-05-22
- Inventor: JAASKELAINEN, Mikko , MANDVIWALA, Tasneem, A.
- Applicant: HALLIBURTON ENERGY SERVICES, INC.
- Applicant Address: 10200 Bellaire Boulevard Houston, TX 77072 US
- Assignee: HALLIBURTON ENERGY SERVICES, INC.
- Current Assignee: HALLIBURTON ENERGY SERVICES, INC.
- Current Assignee Address: 10200 Bellaire Boulevard Houston, TX 77072 US
- Agency: SMITH, Marlin, R.
- Priority: US13/679,940 20121116
- Main IPC: E21B47/10
- IPC: E21B47/10 ; E21B47/135
Abstract:
A method of measuring an electromagnetic field in a formation can include installing an electromagnetic sensor with improved sensitivity, the sensor including multiple optical waveguides and respective multiple materials, and in response to exposure to the electromagnetic field, the materials changing shape in opposite directions. A well system can include an optical electromagnetic sensor which measures an electromagnetic field in a formation, and wherein optical path lengths or phases in optical waveguides of the sensor change both positively and negatively in response to exposure to the electromagnetic field. A method of monitoring a formation can include installing an optical electromagnetic sensor in a wellbore which penetrates the formation, and an optical path length/phase in an optical waveguide of the sensor increasing in response to exposure to the electromagnetic field, and an optical path length/phase in another optical waveguide of the sensor decreasing in response to exposure to the electromagnetic field.
Information query