Invention Application
WO2014081569A1 FIN ISOLATION IN MULTI-GATE FIELD EFFECT TRANSISTORS 审中-公开
多栅极场效应晶体管中的FIN隔离

FIN ISOLATION IN MULTI-GATE FIELD EFFECT TRANSISTORS
Abstract:
A method for fabricating a field effect transistor (FET) device includes forming a plurality of semiconductor fins (302) on a substrate (202), removing a semiconductor fin of the plurality of semiconductor fins from a portion of the substrate, forming an isolation fin (1002) that includes a dielectric material (902) on the substrate on the portion of the substrate, and forming a gate stack (1701) over the plurality of semiconductor fins (302) and the isolation fin (1002).
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