Invention Application
WO2015126630A1 SPEECH INTELLIGIBILITY MEASUREMENT AND OPEN SPACE NOISE MASKING
审中-公开
语音智能测量和开放空间噪声屏蔽
- Patent Title: SPEECH INTELLIGIBILITY MEASUREMENT AND OPEN SPACE NOISE MASKING
- Patent Title (中): 语音智能测量和开放空间噪声屏蔽
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Application No.: PCT/US2015/014579Application Date: 2015-02-05
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Publication No.: WO2015126630A1Publication Date: 2015-08-27
- Inventor: BENWAY, Evan, Harris , PEROTTI, Erik , WOO, Kwangsee, Allen
- Applicant: PLANTRONICS, INC.
- Applicant Address: 345 Encinal Street Santa Cruz, CA 95060 US
- Assignee: PLANTRONICS, INC.
- Current Assignee: PLANTRONICS, INC.
- Current Assignee Address: 345 Encinal Street Santa Cruz, CA 95060 US
- Agency: DEVILLIERS, François
- Priority: US14/188,200 20140224
- Main IPC: H04K3/00
- IPC: H04K3/00
Abstract:
Methods and apparatuses for addressing open space noise are disclosed. In one example, a method for masking open space noise includes outputting a test signal from a speaker, the test signal operable to measure a speech transmission quality of a transmission channel. The method includes receiving the test signal at a microphone, outputting a detected test signal, and processing the detected test signal to determine the speech transmission quality of the transmission channel. The method further includes adjusting an output level of a noise masking signal from the speaker responsive to the speech transmission quality.
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