Invention Application
- Patent Title: SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Patent Title (中): 使用次级离子质谱法进行单细胞分析
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Application No.: PCT/US2016/022160Application Date: 2016-03-11
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Publication No.: WO2016153819A1Publication Date: 2016-09-29
- Inventor: NOLAN, Garry P. , BENDALL, Sean C. , ANGELO, Robert M.
- Applicant: THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY
- Applicant Address: Office of the General Counsel P.O. Box P.O. Box 20386 Building 170, 3rd Floor, Main Quad Stanford, California 94305-2038 US
- Assignee: THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY
- Current Assignee: THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY
- Current Assignee Address: Office of the General Counsel P.O. Box P.O. Box 20386 Building 170, 3rd Floor, Main Quad Stanford, California 94305-2038 US
- Agency: KEDDIE, James S.
- Priority: US62/138,322 20150325
- Main IPC: G01N33/58
- IPC: G01N33/58 ; H01J49/00
Abstract:
A method of analyzing a population of cells is disclosed. In certain embodiments, the method includes i) obtaining an array of cells on a substrate, wherein the cells are labeled with one or more mass tags and are separated from one another, ii) measuring, using secondary ion mass spectrometry (SIMS), the abundance of the one or more mass tags at a plurality of locations occupied by the cells, thereby generating, for each individual cell measured, a set of data, and iii) outputting the set of data for each of the cells analyzed. Also provided herein are systems that find use in performing the subject method. In some embodiments, the system is an automated system for analyzing a population of cells using SIMS.
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