Invention Application
WO2017019909A1 REFRIGERANT ANALYZER AND A METHOD OF USING THE SAME 审中-公开
制冷分析仪及其使用方法

REFRIGERANT ANALYZER AND A METHOD OF USING THE SAME
Abstract:
A method and an analyzer for detecting impurities in refrigerant (e.g. methyl chloride (R40) or Chlorodifluoromethane (R22)), wherein the refrigerant analyzer (12) includes a first sensing device (16), preferably a non-dispersive infrared sensor (NDIR), in flow communication with a second sensing device (18), preferably an electrochemical sensor. The first sensing device is configured to determine a first characteristic of a refrigerant (e.g. absorbance in the IR range), and the second sensing device is configured to detect a second characteristic of the refrigerant (e.g. concentration in ppmv). Preferably, the refrigerant analyzer is a part of a system for detecting impurities (10) and further preferably it comprises flow regulators (20), a scrubber (24) and a processor (22). The scrubber is preferably in flow communication with the first sensing device and it preferably comprises a packing material comprising alumina (AI203, aluminum oxide).
Patent Agency Ranking
0/0