Invention Application
- Patent Title: REFRIGERANT ANALYZER AND A METHOD OF USING THE SAME
- Patent Title (中): 制冷分析仪及其使用方法
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Application No.: PCT/US2016/044578Application Date: 2016-07-28
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Publication No.: WO2017019909A1Publication Date: 2017-02-02
- Inventor: CHEN, Lei , YANG, Zhiwei , POSTGATE, Farley, William , CLOUGH, Warren , RYDKIN, Ivan
- Applicant: CARRIER CORPORATION
- Applicant Address: 1 Carrier Place Farmington, CT 06034 US
- Assignee: CARRIER CORPORATION
- Current Assignee: CARRIER CORPORATION
- Current Assignee Address: 1 Carrier Place Farmington, CT 06034 US
- Agency: COLE, Troy, J.
- Priority: US62/197,778 20150728
- Main IPC: G01N27/27
- IPC: G01N27/27 ; G01N27/407 ; G01N33/00 ; G01N21/3504 ; G01N21/61 ; G01N21/94
Abstract:
A method and an analyzer for detecting impurities in refrigerant (e.g. methyl chloride (R40) or Chlorodifluoromethane (R22)), wherein the refrigerant analyzer (12) includes a first sensing device (16), preferably a non-dispersive infrared sensor (NDIR), in flow communication with a second sensing device (18), preferably an electrochemical sensor. The first sensing device is configured to determine a first characteristic of a refrigerant (e.g. absorbance in the IR range), and the second sensing device is configured to detect a second characteristic of the refrigerant (e.g. concentration in ppmv). Preferably, the refrigerant analyzer is a part of a system for detecting impurities (10) and further preferably it comprises flow regulators (20), a scrubber (24) and a processor (22). The scrubber is preferably in flow communication with the first sensing device and it preferably comprises a packing material comprising alumina (AI203, aluminum oxide).
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