Invention Application
- Patent Title: SPIN HALL EFFECT MRAM WITH THIN-FILM SELECTOR
- Patent Title (中): 带薄膜选择器的SPIN HALL效果MRAM
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Application No.: PCT/US2015/052357Application Date: 2015-09-25
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Publication No.: WO2017052622A1Publication Date: 2017-03-30
- Inventor: KARPOV, Elijah V. , O'BRIEN, Kevin P. , MANIPATRUNI, Sasikanth , YOUNG, Ian A. , DOYLE, Brian S.
- Applicant: INTEL CORPORATION
- Applicant Address: 2200 Mission College Blvd. Santa Clara, California 95052 US
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: 2200 Mission College Blvd. Santa Clara, California 95052 US
- Agency: CZARNECKI, Michael S.
- Main IPC: H01L43/06
- IPC: H01L43/06 ; H01L43/04 ; H01L43/10 ; H01L43/12
Abstract:
A one-transistor (1T), one-selector (1S), one magnetic tunnel junction (1MTJ), spin torque transfer (STT), spin Hall effect (SHE), magnetic random access memory (MRAM) may be configured to provide separate write current and read current paths. In such a configuration, the write current may pass through a SHE electrode disposed proximate the MTJ device. The direction of write current flow through the SHE electrode determines spin polarization of the write current, the magnetic field orientation of a free magnetic layer in the MTJ device, and consequently the resistance of the MTJ device. The write current can be at a level sufficient to cause the reliable storage of binary information in the MTJ device. The read current, at a lower level than the write current, passes through the MTJ.
Information query
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