Invention Application
WO2017052744A3 METHOD AND APPARATUS FOR HIGH SENSITIVITY PARTICULATE DETECTION IN INFRARED DETECTOR ASSEMBLIES
审中-公开
用于红外探测器组件中高灵敏度颗粒检测的方法和设备
- Patent Title: METHOD AND APPARATUS FOR HIGH SENSITIVITY PARTICULATE DETECTION IN INFRARED DETECTOR ASSEMBLIES
- Patent Title (中): 用于红外探测器组件中高灵敏度颗粒检测的方法和设备
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Application No.: PCT/US2016043758Application Date: 2016-07-22
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Publication No.: WO2017052744A3Publication Date: 2017-05-04
- Inventor: MARTIN CHADWICK B , KREMER REX M , TEMKIN JESSE C
- Applicant: RAYTHEON CO
- Assignee: RAYTHEON CO
- Current Assignee: RAYTHEON CO
- Priority: US201514863016 2015-09-23
- Main IPC: G01J5/04
- IPC: G01J5/04 ; G01J5/06 ; G01N21/94
Abstract:
A detector assembly (300, 500) includes a dewar chamber (102, 502) having an aperture (108, 510) and an infrared radiation detector (106, 514). The detector assembly also includes a mirror (304, 400, 410, 504) disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface (306, 604) and an emitting region (305, 402, 412, 606) facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact (322, 712, 722, 802) caused by a particle (110) in the dewar chamber that blocks a portion of the first or second radiation.
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