Invention Application
- Patent Title: ELECTRON-BEAM SPOT OPTIMIZATION
- Patent Title (中): 电子束斑点优化
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Application No.: PCT/US2017/016641Application Date: 2017-02-06
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Publication No.: WO2017184232A1Publication Date: 2017-10-26
- Inventor: PETERSON, Dustin , ZIMMERMAN, Richard , JONES, Vince , MILLER, Eric
- Applicant: MOXTEK, INC.
- Applicant Address: 452 West 1260 North Orem, Utah 84057 US
- Assignee: MOXTEK, INC.
- Current Assignee: MOXTEK, INC.
- Current Assignee Address: 452 West 1260 North Orem, Utah 84057 US
- Agency: HOBSON, Garron M.
- Priority: US62/325,007 20160420; US15/424,270 20170203
- Main IPC: H01J35/14
- IPC: H01J35/14
Abstract:
Electron beam spot characteristics can be tuned in each x-ray tube (10, 30) by moving a focusing-ring (13) along a longitudinal-axis (15) of the x-ray tube. The focusing-ring can then be immovably fastened to the x-ray tube. An x-ray source can include an x-ray tube (10, 30) and a focusing-ring (13). The focusing-ring can at least partially encircle an electron-emitter (14), a cathode (12), an evacuated-enclosure (11), or combinations thereof. The focusing-ring can be located outside of a vacuum of the evacuated enclosure. The focusing-ring can adjust an electron-beam spot (33) on a target material of the x-ray tube when moved along a longitudinal-axis (15) extending linearly from the electron-emitter to the target material.
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