Invention Application
- Patent Title: FAR-INFRARED DETECTION USING WEYL SEMIMETALS
- Patent Title (中): 使用WEYL SEMIMETETAR进行远红外检测
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Application No.: PCT/US2017/043329Application Date: 2017-07-21
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Publication No.: WO2018017976A1Publication Date: 2018-01-25
- Inventor: CHAN, Ching-Kit , LEE, Patrick A. , LINDNER, Netanel , REFAEL, Gil , MA, Qiong , XU, Suyang , GEDIK, Nuh
- Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY , TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED , CALIFORNIA INSTITUTE OF TECHNOLOGY
- Applicant Address: 77 Massachusetts Ave Cambridge, Massachusetts 02139 US
- Assignee: MASSACHUSETTS INSTITUTE OF TECHNOLOGY,TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED,CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee: MASSACHUSETTS INSTITUTE OF TECHNOLOGY,TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED,CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee Address: 77 Massachusetts Ave Cambridge, Massachusetts 02139 US
- Agency: COLICE, Christopher Max et al.
- Priority: US62/365,064 20160721
- Main IPC: H01L31/18
- IPC: H01L31/18 ; H01L31/0224
Abstract:
The generation of photocurrent in an ideal two-dimensional Dirac spectrum is symmetry forbidden. In sharp contrast, a three-dimensional Weyl semimetal can generically support significant photocurrent due to the combination of inversion symmetry breaking and finite tilts of the Weyl spectrum. To realize this photocurrent, a noncentrosymmetric Weyl semimetal is coupled to a pair of electrodes and illuminated with circularly polarized light without any voltage applied to the Weyl semimetal. The wavelength of the incident light can range over tens of microns and can be adjusted by doping the Weyl semimetal to change its chemical potential.
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