Invention Application
- Patent Title: METHODS AND SYSTEMS FOR SCANNING PROBE SAMPLE PROPERTY MEASUREMENT AND IMAGING
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Application No.: PCT/US2019/034200Application Date: 2019-05-28
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Publication No.: WO2019227101A1Publication Date: 2019-11-28
- Inventor: PIESTUN, Rafael , LABOUESSE, Simon , RASCHKE, Markus B. , MULLER, Eric , JOHNSON, Samuel
- Applicant: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE
- Applicant Address: 1800 Grant Street, 8th Floor Denver, Colorado 80203 US
- Assignee: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE
- Current Assignee: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE
- Current Assignee Address: 1800 Grant Street, 8th Floor Denver, Colorado 80203 US
- Agency: BAILEY, Robert A. et al.
- Priority: US62/676,675 20180525
- Main IPC: G01Q20/00
- IPC: G01Q20/00
Abstract:
Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.
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