Invention Application
- Patent Title: SILICON USAGE METERING TO PROVIDE SILICON-AS-A-SERVICE
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Application No.: PCT/CN2020/138531Application Date: 2020-12-23
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Publication No.: WO2022133778A1Publication Date: 2022-06-30
- Inventor: SRINIVASAN, Vasudevan , GRIMSRUD, Knut , VAN DE GROENENDAAL, Johan , ORIOL, Mariusz , AHUJA, Nishi , ZHOU, Shen , ALT, Samantha , BARTFAI-WALCOTT, Katalin , BERENT, Arkadiusz
- Applicant: INTEL CORPORATION , SRINIVASAN, Vasudevan , GRIMSRUD, Knut , VAN DE GROENENDAAL, Johan , ORIOL, Mariusz , AHUJA, Nishi , ZHOU, Shen , ALT, Samantha , BARTFAI-WALCOTT, Katalin , BERENT, Arkadiusz
- Applicant Address: 2200 Mission College Blvd.; 16929 NW Milcliff St.; 48009 SW Morel Ln.; 9590 SW Taylor St.; Piotrkowska 57; 10117 NW Langworthy Terrace; No. 880 Zi Xing Road; 16827 NW Oakridge Dr.; 5284 Da Vinci Dr.; Mila 15, Tuchom
- Assignee: INTEL CORPORATION,SRINIVASAN, Vasudevan,GRIMSRUD, Knut,VAN DE GROENENDAAL, Johan,ORIOL, Mariusz,AHUJA, Nishi,ZHOU, Shen,ALT, Samantha,BARTFAI-WALCOTT, Katalin,BERENT, Arkadiusz
- Current Assignee: INTEL CORPORATION,SRINIVASAN, Vasudevan,GRIMSRUD, Knut,VAN DE GROENENDAAL, Johan,ORIOL, Mariusz,AHUJA, Nishi,ZHOU, Shen,ALT, Samantha,BARTFAI-WALCOTT, Katalin,BERENT, Arkadiusz
- Current Assignee Address: 2200 Mission College Blvd.; 16929 NW Milcliff St.; 48009 SW Morel Ln.; 9590 SW Taylor St.; Piotrkowska 57; 10117 NW Langworthy Terrace; No. 880 Zi Xing Road; 16827 NW Oakridge Dr.; 5284 Da Vinci Dr.; Mila 15, Tuchom
- Agency: CHINA PATENT AGENT (H.K.) LTD.
- Main IPC: G06F17/40
- IPC: G06F17/40
Abstract:
Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to implement software defined silicon feature configuration pay-as-you-go licensing are disclosed. A disclosed silicon semiconductor device includes a first counter that increments a first count when a timer expires and, responsive to expiration of the timer, a feature configuration sampler to sample a state of a configuration of a feature of the silicon semiconductor device. In addition, the silicon semiconductor device includes a second counter that increments a second count when the sampled state of the configuration of the feature indicates the feature is active. A feature up-time tracker is also included outputs a value representative of an amount of time the configuration has been active, where the amount of time is based on the first count and the second count.
Information query