EXTENDED MATERIAL DETECTION INVOLVING A MULTI WAVELENGTH PROJECTOR
Abstract:
Material detection, for example classification if skin or non-skin, involving a projector (116) for illuminating an object (112) with an illumination pattern at a first wavelength and a flood light source (122) configured for scene illumination, wherein the flood light source (122) is configured for emitting the scene illumination having a second wavelength; a sensor element for imaging at least one reflection image, at least one evaluation device (136), wherein the evaluation device (136) is configured for determining at least one first material information of the object (112) by evaluating a beam profile (134) of reflection features, wherein the evaluation device (136) is configured for determining at least one second material information of the object (112) by evaluating the scene image, wherein the evaluation device (136) is configured for determining the material of the object (112) using the first material information and the second material information.
Patent Agency Ranking
0/0