METHOD AND APPARATUS FOR DETERMINING ABSOLUTE POSITION OF A TIP OF AN ELONGATE OBJECT ON A PLANE SURFACE WITH INVARIANT FEATURES
    1.
    发明公开
    METHOD AND APPARATUS FOR DETERMINING ABSOLUTE POSITION OF A TIP OF AN ELONGATE OBJECT ON A PLANE SURFACE WITH INVARIANT FEATURES 审中-公开
    的方法和装置用于确定的细长的点的TOP的绝对位置与稳定特性的平坦表面

    公开(公告)号:EP1706314A4

    公开(公告)日:2011-06-29

    申请号:EP04818087

    申请日:2004-12-22

    IPC分类号: G06F3/033 G06F3/03 G06M7/00

    CPC分类号: G06F3/03545 G06F3/0321

    摘要: A method and apparatus for determining a pose of an elongate object and an absolute position of its tip while the tip is in contact with a plane surface having invariant features. The surface and features are illuminated with a probe radiation and a scattered portion, e.g., the back-scattered portion, of the probe radiation returning from the plane surface and the feature to the elongate object at an angle tau with respect to an axis of the object is detected. The pose is derived from a response of the scattered portion to the surface and the features and the absolute position of the tip on the surface is obtained from the pose and knowledge about the feature. The probe radiation can be directed from the object to the surface at an angle sigma to the axis of the object in the form of a scan beam. The scan beam can be made to follow a scan pattern with the aid of a scanning arrangement with one or more arms and one or more uniaxial or biaxial scanners. Angle tau can also be varied, e.g., with the aid of a separate or the same scanning arrangement as used to direct probe radiation to the surface. The object can be a pointer, a robotic arm, a cane or a jotting implement such as a pen, and the features can be edges, micro-structure or macro-structure belonging to, deposited on or attached to the surface which the tip of the object is contacting.

    摘要翻译: 一种用于确定性采矿方法和装置的细长物体的姿势和其尖端的绝对位置,而尖端与具有不变特征的平面表面接触。 表面和特征与探针辐射和散射部分,例如,反向散射部分,所述样品的辐射从所述平面表面返回的与特征到细长物体处的轴线发亮的角度头相对于 检测对象。 姿势是从由约特征的姿态和知识获得的散射部分的表面和所述的特征和表面上的尖端的绝对位置的响应导出。 测试辐射可以在从在扫描光束的形式的物体的轴线西格玛角度的对象的表面被引导。 扫描光束可以由跟随用扫描装置的与一个或多个臂以及一个或多个单轴或双轴扫描仪的辅助的扫描图案。 作为用于将辐射引导到样品表面的角度的tau因此可以改变,E. G.,与单独的或相同的扫描装置的帮助。 该对象可以是一个指针,一个机器人臂,手杖或一个书写工具:诸如笔,和特征可以是边缘,微结构或属于宏观结构,沉积在或附着于表面,尖端的 该对象被接触。