摘要:
The invention concerns a method of monitoring the quality of filler gases, in particular sulphur hexafluoride (SF6), in gas-filled installations, in particular gas-insulated switchgear such as high- and medium-voltage switches. The aim of the invention is to propose a method which makes continuous monitoring of filler-gas quality possible, at the same time making it possible to locate any fault and determine the type of fault in the installation. This is achieved by virtue of the fact that the filler gas is continuously exchanged, at least for the time taken to carry out the analysis, between the installation and an ion-mobility spectrometer in which the filler gas is ionized and the ions thus formed are analysed in the drift channel of the spectrometer.