公开(公告)号：EP2072997A1

公开(公告)日：2009-06-24

申请号：EP07807250.1

申请日：2007-09-13

Applicant: Hamamatsu Photonics K.K.

Inventor： KAWADA, Yoichi ,  YASUDA, Takashi ,  TAKAHASHI, Hironori ,  AOSHIMA, Shinichiro

IPC: G01N21/35

CPC classification number: G01N21/35 ,  G01N21/23 ,  G01N21/3581

Abstract: A single terahertz wave time-waveform measuring device 1 acquires information on an object to be measured 9 by using a terahertz wave, and includes a light source 11, a beam diameter adjuster 12, a separator 13, a terahertz wave generator 21, a light path length difference adjuster 31, a pulse front tilting unit 32, a polarizer 33, a wave synthesizer 41, an electro-optic crystal 42, an analyzer 43, and a photodetector 44. The terahertz wave generator 21 generates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unit 32 makes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystal 42 nonparallel to each other by tilting the pulse front of the probe light.

Abstract translation: 单个太赫波时间波形测量装置1通过使用太赫兹波获取关于被测量物体9的信息，并且包括光源11，光束直径调节器12，隔膜13，太赫兹波发生器21，光 路径长度差调节器31，脉冲前倾斜单元32，偏振器33，波合成器41，电光晶体42，分析器43和光电检测器44.太赫兹波发生器21响应地产生脉冲太赫兹波 到泵浦光的输入并输出脉冲太赫兹波。 当脉冲前倾斜单元32通过倾斜探测光的脉冲前沿而相互平行地输入到电光晶体42中时，使太赫兹波和探测光的脉冲前沿。

公开(公告)号：EP2857827B1

公开(公告)日：2017-10-11

申请号：EP13796936.6

申请日：2013-05-02

Applicant: Hamamatsu Photonics K.K.

Inventor： AKIYAMA, Kouichiro ,  YASUDA, Takashi ,  KAWADA, Yoichi ,  NAKANISHI, Atsushi

IPC: G01N21/35 ,  G01N21/552 ,  G01N21/3581 ,  G01N21/3586

CPC classification number: G01N21/3586 ,  G01N21/3581

公开(公告)号：EP2128600A1

公开(公告)日：2009-12-02

申请号：EP08711194.4

申请日：2008-02-13

Applicant: Hamamatsu Photonics K.K.

Inventor： YASUDA, Takashi ,  KAWADA, Yoichi ,  TAKAHASHI, Hironori ,  AOSHIMA, Shinichiro

IPC: G01N21/35

CPC classification number: G01N21/3581 ,  G01N21/552

Abstract: A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a 1/4 wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31 a, an exit plane 31 b, and a reflection plane 31 c. The terahertz wave generating element 20 is provided to be integrated with the entrance plane 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit plane 31b of the internal total reflection prism 31.

Abstract translation: 全反射太赫波测量装置1被配置为通过使用太赫兹波的全反射测量方法获取关于被摄体S的信息，并且包括光源11，分支部12，斩波器13，光路长度 差分调整部14，偏振片15，隔膜17，太赫波生成元件20，内部全反射棱镜31，太赫兹波检测元件40，1/4波长板51，偏振光分离元件52，光电检测器 53A，光电检测器53B，差分放大器54和锁定放大器55.内部全反射棱镜31是所谓的平行棱镜，并且具有入射面31a，出射面31b和反射 飞机31 c。 太赫兹波产生元件20设置成与内部全反射棱镜31的入射面31a成一体，并且太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化。