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公开(公告)号:EP4174501B1
公开(公告)日:2024-06-19
申请号:EP22199485.8
申请日:2022-10-04
IPC分类号: G01R31/28
CPC分类号: G01R31/2844 , G01R31/006 , G01R31/2841
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22.
公开(公告)号:EP4043892B1
公开(公告)日:2024-06-19
申请号:EP22165853.7
申请日:2018-09-30
IPC分类号: G01R31/40 , G01R19/165 , G01R31/28
CPC分类号: G01R19/16595 , G01R31/2827 , G01R19/16547 , G01R31/40 , Y02E60/10
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23.
公开(公告)号:EP4381304A1
公开(公告)日:2024-06-12
申请号:EP22772959.7
申请日:2022-09-05
申请人: ERS electronic GmbH
发明人: REITINGER, Klemens
IPC分类号: G01R31/28 , G01R31/3185 , H01L21/687
CPC分类号: G01R31/318511 , G01R31/2831
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公开(公告)号:EP4379403A1
公开(公告)日:2024-06-05
申请号:EP22847792.3
申请日:2022-01-20
发明人: LIANG, Yuquan , ZHANG, Qijie , QIU, Guozhi
IPC分类号: G01R31/28
摘要: A test apparatus, which is configured for testing an electronic element, and includes a test table (10) and a circuit board (20). The circuit board (20) is electrically connected to the test table (10); the test table (10) is provided with an air-intake hole (14), an air-out hole (15) and a gas flow channel (16); and the gas flow channel (16) is connected to and in communication with the air-intake hole (14) and the air-out hole (15), respectively, so that gas is capable of entering the gas flow channel (16) from the air-intake hole (14), flowing out from the air-out hole (15), and coming into contact with the circuit board (20) so as to control a temperature of the circuit board (20) to be within a range of -10 °C to 100 °C.
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25.
公开(公告)号:EP4356418A1
公开(公告)日:2024-04-24
申请号:EP21915965.4
申请日:2021-12-29
发明人: TAN, Teck Huat , LOW, Chun Hong
CPC分类号: H01L21/67775 , H01L21/67724 , H01L21/67754 , G01R31/2862 , G01R31/2868 , G01R31/2867
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公开(公告)号:EP4356149A1
公开(公告)日:2024-04-24
申请号:EP22741128.7
申请日:2022-06-06
申请人: Xallent Inc.
CPC分类号: G01R1/07342 , G01R1/06744 , G01R31/2889
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公开(公告)号:EP4163659B8
公开(公告)日:2024-04-24
申请号:EP22198762.1
申请日:2022-09-29
CPC分类号: G01R35/02 , G01R31/2829
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公开(公告)号:EP4354162A2
公开(公告)日:2024-04-17
申请号:EP24160048.5
申请日:2015-12-04
IPC分类号: G01R31/28
CPC分类号: G01N21/95 , G01N21/8806 , G01N21/9505 , G01N21/95684 , G01R31/01
摘要: An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.
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公开(公告)号:EP3933419B1
公开(公告)日:2024-04-03
申请号:EP20305738.5
申请日:2020-07-01
发明人: SEGARRA, Laurent , SWANENBERG, Maarten Jacobus , TURPIN, Pierre , BACCHI, Matthew , SCHALLER, Russell , JACKOSKI, Keith , ZHU, Ronghua
IPC分类号: G01R31/28
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