VORRICHTUNG ZUR MESSUNG UND/ODER ÜBERWACHUNG EINER PHYSIKALISCHEN ODER CHEMISCHEN PROZESSGRÖSSE
    31.
    发明公开
    VORRICHTUNG ZUR MESSUNG UND/ODER ÜBERWACHUNG EINER PHYSIKALISCHEN ODER CHEMISCHEN PROZESSGRÖSSE 有权
    用于测量和/或监测物理或化学加工尺寸

    公开(公告)号:EP1446639A1

    公开(公告)日:2004-08-18

    申请号:EP02790344.2

    申请日:2002-11-08

    IPC分类号: G01D3/02 G01D18/00

    CPC分类号: G01D18/008 G01D3/022

    摘要: The invention relates to a device for measuring and/or monitoring a physical or chemical process variable, comprising a measuring and/or monitoring appliance (2), at least one memory unit (3) and one display, input and/or output unit (4; 5). The at least one memory unit (3) is embodied as a non-volatile, writable memory. Information (13) relating to the firm, device and/or process is or can be stored in the at least one memory unit (3). Desired information (13) can be called by the display unit (4) or by the input/output unit (5) and/or can be automatically displayed according to a defined state of the measuring and/or monitoring appliance (2). Said information (13) is represented on the at least one program side (12) or is output when the at least one program side (12) is called.