摘要:
An optical time domain reflectometer (1) receives a return light of an optical pulse incident on a measurement target optical fiber (W) formed out of a plurality of optical fibers coupled in series, and measures the splice loss, return loss and unit length loss of the measurement target optical fiber. A maximum value detector (3) detects a maximum value due to an absolute value for the splice loss and maximum values for the return loss and the unit length loss of the measurement target optical fiber, respectively, in response to the return light. A display unit (19) displays the maximum value due to the absolute value for the splice loss and the maximum values for the return loss and the unit length loss according to items of the splice loss, the return loss and the unit length loss based on output from the maximum value detector (3).
摘要:
A combination weighing apparatus is constituted by a plurality of hopper supporting arms (100) protruding to an external portion from a casing having a plurality of drive sources (63) in an inner portion thereof and sealing opening and closing operation driving mechanisms (116) for transmitting a drive force from the drive sources (63) in inner portions thereof, a plurality of hoppers (130) attached to front ends of a plurality of hopper supporting arms (100), having receiving ports for subjects to be weighed at upper ends and having discharge ports with rotatable opening and closing lids (147) at lower ends, couplings respectively mounted to the opening and closing lids (147), and opening and closing operation driving bodies exposing to outer surfaces of the hopper attaching portions at the front ends of the hopper supporting arms (100), driven by the opening and closing operation driving mechanisms (116), and opening and closing the opening and closing lids (147) engaged with the couplings due to the attachment of the hoppers (130), whereby a cleaning can be easily performed as a whole.
摘要:
A combined metering apparatus comprising a plurality of pool hoppers for receiving the target metering objects and a plurality of metering hoppers for receiving the target metering objects falling from said plurality of pool hoppers, a plurality of metering means is provided in association with said plurality of metering hoppers to separately meter the target metering objects received in said plurality of metering hoppers. A selecting means is provided for selecting a combination of the target metering objects providing a predetermined metered value in said plurality of metering hoppers. A collecting and discharging means is provided for collecting and discharging the target metering objects. A plurality of timing hoppers are provided for receiving the target metering objects falling from corresponding ones of said plurality of metering hoppers. Said plurality of timing hoppers being arranged in sets on a lower stage side of said plurality of metering hoppers to correspond thereto. Each of the sets is consisting of a third cylindrical body having upper and lower open end portions, and a third bottom plate slidable to selectively open/close a lower open end portion of said third cylindrical body at a timing delayed from opening/closing operations of other third cylindrical bodies by a predetermined period of time. Said collecting and discharging means is provided for collecting and discharging the target metering objects falling from said plurality of timing hoppers.
摘要:
In a file (29, 30), the TDEV mask data information including the TDEV mask data constituted by connecting a plurality of line segments and a calculation expression for forming the TDEV mask data, are stored in advance. A readout section (32, 35) reads out a predetermined TDEV mask data information from the file. A display section (28) displays the line segment which is represented by the desired TDEV mask data information. An operating section (27) inputs information for changing at least one of the start point and the characteristic value to the desired value with respect to the line segment to be represented by the desired TDEV mask data information. A TDEV mask data change section (34, 37) receives information inputted by the operating section (27) and changes TDEV mask data information based on the calculation expression of the TDEV mask data information, and allows the display section (28) to display the line segment represented by the changed TDEV mask data information.
摘要:
A delay time measurement apparatus for an optical element includes a pulse light source (42), wavelength setting unit (41), optical power divider (44), optical delay unit (48), controller (52), and detector (46, 53). The pulse light source (42) can vary the wavelength of light to be output, and outputs an optical pulse having a predetermined repetition period. The wavelength setting unit (42) sets the wavelength of light to be output from the pulse light source. The optical power divider (44) divides the optical pulse output from the pulse light source into a first optical pulse and a second optical pulse to be input to an optical element as the object to be measured. The optical delay unit (48) can vary the spatial optical path length along which the first optical pulse divided by the optical power divider travels. The controller (52) changes the spatial optical path length of the optical delay unit. The detector (46, 53) receives a measurement optical pulse output from the optical element as the object to be measured, and a reference optical pulse output from the optical delay unit, and detects the delay time of light that has passed through the optical element as the object to be measured from a change in spatial optical path length required for superposing the measurement and reference optical pulses on each other.
摘要:
In order to easily understand a synthetic quality degree, a ratio of each of parameters in the entirety, etc. in an ATM line (10) to be evaluated, cell data is received from the ATM line and abnormal cells are detected by a misinserted cell detection section (21), a lost cell detection section (23) and an errored cell detection section (25). The numbers of abnormal cells occurring in the same time period are counted by a misinserted cell count section (22), a lost cell count section (24) and an errored cell count section (26). A total number graph display section (27) displays a strip-shaped total number graph, which corresponds in length to a sum of count results of the respective count sections (22, 24, 26), successively on a time-axis of a screen of a display device (32). An items display section (28) discriminatively displays a plurality of regions into which the total number graph is divided such that the regions have lengths corresponding to the numbers of abnormal cells counted by the respective count sections (22, 24, 26).
摘要:
To measure the optical power level of light from an object (11) to be measured, a bias section (6) applies to a photo-detecting section (5) such a reverse bias voltage as makes the current multiplication factor M almost zero to prevent the output current from flowing and such a reverse bias voltage as makes the M one or more to allow the output current to flow. A processing section (9) determines an offset level from the output of a direct-current amplifying section (7) during an offset data acquisition period that the M is almost zero. The time T0 from when the bias section (6) applies to the photo-detecting section (5) such a reverse bias voltage as makes the M one or more to when the reverse bias voltage applied to make the M zero is determined to be a measurement state. The processing section (9) measures the optical power with a clock faster than time T0. The processing section (9) subtracts the offset level from the measured optical power level to compensate for the offset, thereby determining the correct optical power level of the measured object (11). This makes it possible to automatically perform offset compensation without shading light before measurement and realize highly accurate measurement.
摘要:
A processing unit (12) reads out, from a memory (10), wavelength setting data corresponding to wavelength information from a key input section (9), and outputs a wavelength setting command corresponding to the wavelength setting data to a tunable-wavelength control section (13) and a spectral wavelength control section (14). The tunable-wavelength control section (13) controls a tunable-wavelength light source section (1) to output a laser beam having a wavelength corresponding to the wavelength setting data. The spectral wavelength control section (14) controls a spectroscope section (6) to perform spectroscopy of the light having the wavelength corresponding to the wavelength setting data and output the resultant light. Output light from the tunable-wavelength light source section (1) whose wavelength has been set is input to an object (15) to be measured. Light passing through the object (15) is input to the spectroscope section (6). The spectroscope section (6) performs spectroscopy of only the light having the wavelength corresponding to the wavelength setting data. A light-receiving section (7) receives the spectral light and photoelectrically converts it. The resultant light is converted into digital data by an A/D conversion section (8) to be input as level data to a processing unit (12). The processing unit (12) obtains a light-reception level on the basis of the digital level data.