公开(公告)号：EP1808688A1

公开(公告)日：2007-07-18

申请号：EP05805480.0

申请日：2005-11-01

Applicant: Olympus Corporation

Inventor： SAWADA, Ryuji c/o Olympus Intel Prop Serv.Co. ,  NAKASHIMA, Yoshio c/o Olympus Intel Prop Serv.Co.

IPC: G01N21/64 ,  G02B21/00

CPC classification number: G01N21/6458 ,  G01N2201/10 ,  G02B21/0076 ,  G02B21/16

Abstract: A light fluctuation measuring apparatus, comprising a parameter setting unit 2 which sets parameters of a microscopic image obtaining unit and/or parameters of a light emission measuring unit used for observing light emission in a desired area of a sample in time series, a parameter storage 4 which stores parameters, a mode selector 3 which selects one of a microscopic image obtaining mode for obtaining a microscopic image by a microscopic image obtaining unit, and a light emission measuring mode for observing light emission in a desired area by a light emission measuring unit, and a control unit 1 which reads parameters stored in the storage 4 based on a selected mode, inputs the parameter to a microscopic image obtaining unit or a light emission measuring unit, and controls these units.

Abstract translation: 一种光波动测量装置，包括参数设置单元2，其设置用于以时间序列观察样品的期望区域中的发光的微观图像获得单元的参数和/或用于观察发光的发光测量单元的参数;参数存储 4，其存储参数;模式选择器3，其选择通过微观图像获得单元获得显微图像的显微图像获得模式之一;以及发光测量模式，用于通过发光测量单元观察所需区域中的发光 以及基于所选择的模式读取存储在存储器4中的参数的控制单元1，将该参数输入到微观图像获取单元或发光测量单元，并且控制这些单元。