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公开(公告)号:EP0083196B1
公开(公告)日:1986-03-05
申请号:EP82306838.2
申请日:1982-12-21
发明人: Tada, Kohji c/o Osaka Works , Kuhara, Yoshiki c/o Osaka Works , Tatsumi, Masami c/o Osaka Works , Kawakami, Akihiko c/o Osaka Works
CPC分类号: G01R29/0885 , G01R15/242 , G01R29/12
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公开(公告)号:EP0083196A1
公开(公告)日:1983-07-06
申请号:EP82306838.2
申请日:1982-12-21
发明人: Tada, Kohji c/o Osaka Works , Kuhara, Yoshiki c/o Osaka Works , Tatsumi, Masami c/o Osaka Works , Kawakami, Akihiko c/o Osaka Works
CPC分类号: G01R29/0885 , G01R15/242 , G01R29/12
摘要: A voltage and electric field measuring device using light, including a polariser (2), an electro-optic crystal (4) consisting of a material having an optical rotatory power, and an analyser (5) arranged in this order in the direction of advance of applied light. A quarter-wave plate (3) is disposed between the polariser (2) and crystal (4) or between the crystal (4) and analyser (5). The angle of orientation Ψ of the analyser (5), relative to the optical axis of the crystal (4), is set to the product of 0 and f, where θ represents the optical rotatory power, with respect to the applied light, of the crystal (4) near a point at the centre of a range of varying temperatures at the installation environment, and e represents the thickness of the crystal (4) measured in the direction of advance of light. The specified relation between Ψ and θ·ℓ maximises the temperature stability of the device by ensuring that the sensitivity of the device is substantially independent of temperature.
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