Self-testing memory arrangement and method
    2.
    发明公开
    Self-testing memory arrangement and method 失效
    电话系统和方法。

    公开(公告)号:EP0292206A1

    公开(公告)日:1988-11-23

    申请号:EP88304331.7

    申请日:1988-05-13

    CPC classification number: G11C29/28

    Abstract: A self-testing memory simultaneously writes test pat­terns into the memory banks of the memory, simultaneously com­pares the contents of one of the memory banks with the contents of the other of the banks, and records errors when the contents of the one memory bank differ from the contents of the other banks.

    Abstract translation: 自检存储器同时将测试图案写入存储器的存储器组,同时将存储体之一的内容与另一个存储体的内容进行比较,并且当一个存储体的内容不同于 其他银行的内容。

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