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135 条记录 (耗时 0.019 秒)

    TEST INSTRUMENTS AND METHODS FOR COMPENSATING IQ IMBALANCE
    5.
    发明公开
    TEST INSTRUMENTS AND METHODS FOR COMPENSATING IQ IMBALANCE 审中-公开

    公开(公告)号：EP4001927A1

    公开(公告)日：2022-05-25

    申请号：EP22150219.8

    申请日：2019-06-28

    申请人： Viavi Solutions Inc.

    发明人： VERGEL, Julio ,  MOORE, Daniel ,  BALU, Raja

    IPC分类号： G01R1/00 ,  H04B17/00 ,  H04B1/30 ,  H04B17/21 ,  H04L27/38

    摘要： A test instrument may include a transmitter configured to transmit signals to a unit under test and a controller configured to generate a transmitter compensation filter by transmitting, via the transmitter, complex multi-sine signals over a first plurality of observed frequencies within a predetermined baseband frequency range, estimating a first plurality of frequency responses that compensate for in-phase and quadrature (IQ) imbalance at the first plurality of observed frequencies within the predetermined baseband frequency range, and determining, using the first plurality of frequency responses, a transmitter polynomial surface.

    SECONDARY BATTERY SYSTEM AND METHOD OF ESTIMATING STRESS OF ACTIVE MATERIAL OF SECONDARY BATTERY
    6.
    发明公开
    SECONDARY BATTERY SYSTEM AND METHOD OF ESTIMATING STRESS OF ACTIVE MATERIAL OF SECONDARY BATTERY 审中-公开

    公开(公告)号：EP3499612A1

    公开(公告)日：2019-06-19

    申请号：EP18207465.8

    申请日：2018-11-21

    申请人： TOYOTA JIDOSHA KABUSHIKI KAISHA

    发明人： TAKAHASHI, Kenji

    IPC分类号： H01M4/38 ,  H01M10/052 ,  H01M10/48 ,  H01M4/02 ,  G01R1/00

    摘要： A secondary battery system (2) includes an electronic control unit (ECU) (100) that estimates surface stress (σ) generated in a negative-electrode active material (71) upon incorporation or removal of lithium in a negative electrode (117) of a battery assembly (10). The ECU (100) calculates an estimated value of the surface stress (σ) from a difference obtained by subtracting a reference lithium amount from an amount of lithium contained in the negative-electrode active material (71), using a linear relationship between the difference and the surface stress (σ). The ECU (100) sets the surface stress (σ) to yield stress when the magnitude of the estimated value is larger than that of the yield stress (compressive stress (σ com ) or tensile stress (σ ten )) of the active material, and employs the estimated value as the surface stress (σ) when the magnitude of the estimated value is smaller than that of the yield stress.

    A signal acquisition device
    8.
    发明公开
    A signal acquisition device 审中-公开
    Signalerfassungsvorrichtung

    公开(公告)号：EP2282296A1

    公开(公告)日：2011-02-09

    申请号：EP09166984.6

    申请日：2009-07-31

    申请人： Robert Bosch GmbH

    发明人： Boehl, Eberhard ,  Knauss, Matthias ,  Schmitt, Stephen ,  Hanisch, Juergen ,  Kurrer, Rolf ,  Pawlok, Bernard

    IPC分类号： G07C5/08 ,  G01R1/00

    CPC分类号： G07C5/08

    摘要： The invention relates to a signal acquisition device (10) which receives an input signal (12), a physical data (16) and a timing data (20) to generate an output data (24). The signal acquisition device (10) keeps monitoring the input signal (12) for a valid edge. When a valid edge is detected, the signal acquisition device (10) reads the physical data (16) from a physical data processing module (18) and a timing data (20) from a timing module (22) to generate the output data (24) which comprises the new state of the input signal (12), the physical data (16) and the timing data (20). The output data (24) is written to a storage means (11) and also sent out to CPU or any other devices.

    摘要翻译： 本发明涉及一种接收输入信号（12），物理数据（16）和定时数据（20）以产生输出数据（24）的信号采集装置（10）。 信号采集装置（10）对输入信号（12）持续监视有效边沿。 当检测到有效边沿时，信号采集装置（10）从物理数据处理模块（18）和定时模块（22）读取物理数据（16）和定时数据（20），以产生输出数据 24），其包括输入信号（12）的新状态，物理数据（16）和定时数据（20）。 输出数据（24）被写入存储装置（11），并且还发送到CPU或任何其他装置。

    METHOD AND APPARATUS FOR MEASURING IMPEDANCE OF ELECTRICAL COMPONENT UNDER HIGH INTERFERENCE CONDITIONS
    9.
    发明公开
    METHOD AND APPARATUS FOR MEASURING IMPEDANCE OF ELECTRICAL COMPONENT UNDER HIGH INTERFERENCE CONDITIONS 审中-公开
    方法和设备用于测量电气元件的阻抗强干扰条款

    公开(公告)号：EP1660891A2

    公开(公告)日：2006-05-31

    申请号：EP04781486.8

    申请日：2004-08-18

    申请人： HUBBELL INCORPORATED

    发明人： GRUN, Thomas

    IPC分类号： G01R1/00

    CPC分类号： G01R21/001 ,  G01R27/16 ,  G01R31/1245

    摘要： A test system and method having a test channel and an additional channel (212), and wherein the ratio of amplitude and phase between the interference current through the device under test (208) and the interference signal on the additional channel (212) are determined. The system further applies a voltage (202) at or near line frequency to the device under test (208), and then continuously subtracts the additional interference signal from the current signal through the device under test. In doing so, the system and method allows accurate measurements of the real and reactive power of an impedance at or very close to the line frequency.

    LIQUID-CRYSTAL VOLTAGE INDICATOR
    10.
    发明公开
    LIQUID-CRYSTAL VOLTAGE INDICATOR 审中-公开
    液晶显器显示电压

    公开(公告)号：EP1597596A2

    公开(公告)日：2005-11-23

    申请号：EP04707342.4

    申请日：2004-02-02

    申请人： ABB Sp. z.o.o.

    发明人： CZYZEWSKI, Jan

    IPC分类号： G01R1/00

    CPC分类号： G01R19/155

    摘要： The subject of the invention is a liquid crystal indicator of voltage presence in electric conductors and equipment. The device is used to indicate the presence of an AC voltage, especially in medium and high voltage systems. The indicator according to the invention comprises two substrate layers (1) and (5), on which conducting layers (2) and (4) are deposited, and a terminal (6) being an external electric output of the indicator is connected to the layer (2). A structure containing liquid crystal is located between these layers. In the second embodiment of the invention the indicator comprises two substrate layers (10) and (50) with conducting segments (20a, 20b, 20c) and (40d, 40e) deposited on their surfaces, between which an intermediate liquid crystal layer (30) is located. A fragment of each segment deposited on one substrate layer overlaps with at least one fragment of a segment deposited on the other substrate layer, and the overlapping fragments of the conducting segments from both substrate layers, together with a part of the intermediate liquid crystal layer, form liquid crystal elements of the indicator (70ad, 70db, 70be, 70ec , which are electrically connected in series. The liquid crystal elements, in the section plane parallel to the substrate layers, form together an image of the sign, which is displayed in the presence of voltage. The whole area of the conducting segment (20a), located on the surface of the substrate layer (10) outside the outline of the sign image, is the current-collecting electrode of the liquid crystal indicator, and the liquid crystal elements are shaped in such a way that the projection of one liquid crystal element (7Oad) onto the plane of one of the substrate layers, (10) or (50), has the form of a strip bordering the outside contour of the displayed sign image, and the projections of the other liquid crystal elements (70db,70be,70ec) are situated within the area of the sign image delimited by that strip.