摘要:
A measurement instrument (14) for testing a device under test is described. The device under test (12) has at least two test points (20, 24). The measurement instrument (14) comprises a first measurement channel (30), a second measurement channel (32), and a machine-learning module (34). The first measurement channel (30) is configured to process a first input signal associated with one of the at least two test points (20, 24), thereby generating a first measurement signal. The second measurement channel (32) is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning module (34) is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system (10) and a signal processing method are described.
摘要:
Systems, methods, and computer readable medium described herein relate to techniques for characterizing and/or anomaly detection in integrated circuits such as, but not limited to, field programmable gate arrays (FPGAs) and application-specific integrated circuits (ASICs). In one example aspect of certain example embodiments, a fully digital technique relies on the pulse width of signals propagated through a path under test. In another example aspect, the re-configurability of the integrated circuit is leveraged to combine the pulse propagation technique with a delay characterization technique to yield better detection of certain type of Trojans and the like. Another example aspect provides for running the test through reconfigurable path segments in order to isolate and identify anomalous circuit elements. Yet another example aspect provides for performing the characterization and anomaly detection without requiring golden references and the like.
摘要:
The present invention provides a measuring device (1, 11) for measuring signals (2, 12), the measuring device (1, 11) comprising a data memory (4, 14) configured to store device data (5, 15) for the measuring device (1, 11), and a data interface (6, 16) connected to the data memory (4, 14) and configured to read the device data (5, 15) from the data memory (4, 14) and output at least a part of the read device data (5, 15) to an external memory device (7, 17) in a storage mode and to read device data (5, 15) from the external memory device (7, 17) and store the read device data (5, 15) in the data memory (4, 14) in a recovery mode. The present invention further provides a corresponding method for such a measuring device (1, 11).
摘要:
There is provided a computerized mechanism for vulnerability evaluation in a layout having circuitry units as interceptors, comprising receiving a layout with interceptors incorporated therein at prearranged positions, virtually inducing faults in the layout by modeling a physical phenomenon that affects timings in the layout, detecting timing violations in the layout responsive to the induced faults based on discrepancies between the timings and provided specifications thereof determining vulnerability of the layout to faults according to detected faults, and wherein the method is performed on an at least one computerized apparatus configured to perform the method.
摘要:
The invention provides a method for tracing and processing smart card interactive data comprising the following steps: S1. monitoring and collecting original interactive data of respective contacts VCC/IO/RST/CLK of smart card; S2. parsing the original data into smart card communication protocol byte stream; S3. organizing the communication protocol byte stream into communication protocol data sequence; S4. displaying the protocol data sequence to users of system; S5. saving the communication protocol data sequence; S6. converting he communication protocol data sequence into smart card instruction sequence; S7. performing the smart card instruction sequence, rapidly testing cards of the same category and then terminating current tracing. Between the S1 and the termination of current tracing, there are further comprised the following two simultaneously performed tasks: Sm. plotting waveform diagram of smart card interactive data based on the original interactive data and displaying it; Sn. incrementally saving the original interactive data. The invention may achieve the aim of completely recreating field test to better analyze and solve problems.
摘要:
System and method are provided for continually monitoring reliability, or aging, of a digital system and for issuing a warning signal if digital system operation degrades past a specified threshold. The technique includes implementing a ring oscillator sensor in association with the digital system, wherein logic and/or device percent composition of the ring oscillator sensor mirrors percent composition thereof within the digital system. Counter logic is coupled to the ring oscillator sensor for converting outputted count signals to an oscillation frequency, and control logic is coupled to the counter logic for periodically evaluating oscillation frequency of the ring oscillator sensor and generating a warning signal indicative of reliability degradation if at least one of: (i) a measured or estimated oscillation frequency is below a warning threshold frequency; or (ii) a measured or estimated rate of change in a difference between measured oscillation frequencies exceeds an acceptable rate of change threshold.
摘要:
Die vorliegende Erfindung betrifft das Prüfen eines Chips, auf dem ein kryptographisches Verfahren implementiert ist. Dabei wird ein erstes Ergebnis bestimmt durch: ein erstes Ausführen der Basisfunktion unter Verwendung einer ersten Zahl als Parameter der Basisfunktion; und ein zweites Ausführen der Basisfunktion unter Verwendung einer zweiten Zahl als Parameter der Basisfunktion, wobei die erste und die zweite Zahl Zufallszahlen sind. Ein zweites Ergebnis wird bestimmt durch: Bestimmen einer dritten Zahl durch Ausführen einer mathematischen Operation, bei der die erste und die zweite Zahl Operanden der mathematischen Operation sind; und ein drittes Ausführen der Basisfunktion unter Verwendung der dritten Zahl als Parameter der Basisfunktion. Der Chip wird als fehlerfrei angezeigt, wenn das erste und das zweite Ergebnis gleich sind. Die vorliegende Erfindung ist dort anwendbar, wo ein sicheres Handhaben von Daten gewünscht ist. Sie ermöglicht ein zuverlässiges Testen von Chips, auf denen kryptographische Verfahren implementiert sind.