MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING METHOD

    公开(公告)号:EP3936877A1

    公开(公告)日:2022-01-12

    申请号:EP21153097.7

    申请日:2021-01-22

    发明人: Schaefer, Andrew

    IPC分类号: G01R31/3193 G01R13/02

    摘要: A measurement instrument (14) for testing a device under test is described. The device under test (12) has at least two test points (20, 24). The measurement instrument (14) comprises a first measurement channel (30), a second measurement channel (32), and a machine-learning module (34). The first measurement channel (30) is configured to process a first input signal associated with one of the at least two test points (20, 24), thereby generating a first measurement signal. The second measurement channel (32) is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning module (34) is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system (10) and a signal processing method are described.

    SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION IN INTEGRATED CIRCUITS

    公开(公告)号:EP3726232A1

    公开(公告)日:2020-10-21

    申请号:EP20169415.5

    申请日:2020-04-14

    申请人: GrammaTech, Inc.

    IPC分类号: G01R31/3193 G01R31/3183

    摘要: Systems, methods, and computer readable medium described herein relate to techniques for characterizing and/or anomaly detection in integrated circuits such as, but not limited to, field programmable gate arrays (FPGAs) and application-specific integrated circuits (ASICs). In one example aspect of certain example embodiments, a fully digital technique relies on the pulse width of signals propagated through a path under test. In another example aspect, the re-configurability of the integrated circuit is leveraged to combine the pulse propagation technique with a delay characterization technique to yield better detection of certain type of Trojans and the like. Another example aspect provides for running the test through reconfigurable path segments in order to isolate and identify anomalous circuit elements. Yet another example aspect provides for performing the characterization and anomaly detection without requiring golden references and the like.

    MEASURING DEVICE FOR MEASURING SIGNALS AND DATA HANDLING METHOD
    6.
    发明公开
    MEASURING DEVICE FOR MEASURING SIGNALS AND DATA HANDLING METHOD 审中-公开
    测量信号的测量装置和数据处理方法

    公开(公告)号:EP3315977A1

    公开(公告)日:2018-05-02

    申请号:EP16196548.8

    申请日:2016-10-31

    发明人: GUENTHER, Mario

    IPC分类号: G01R13/02 G01R31/3193

    摘要: The present invention provides a measuring device (1, 11) for measuring signals (2, 12), the measuring device (1, 11) comprising a data memory (4, 14) configured to store device data (5, 15) for the measuring device (1, 11), and a data interface (6, 16) connected to the data memory (4, 14) and configured to read the device data (5, 15) from the data memory (4, 14) and output at least a part of the read device data (5, 15) to an external memory device (7, 17) in a storage mode and to read device data (5, 15) from the external memory device (7, 17) and store the read device data (5, 15) in the data memory (4, 14) in a recovery mode. The present invention further provides a corresponding method for such a measuring device (1, 11).

    摘要翻译: 本发明提供一种用于测量信号(2,12)的测量装置(1,11),所述测量装置(1,11)包括数据存储器(4,14),所述数据存储器(4,14)被配置为存储装置数据 测量装置(1,11)以及连接到所述数据存储器(4,14)并且被配置为从所述数据存储器(4,14)读取所述装置数据(5,15)并输出的数据接口(6,16) 在存储模式下将读取的设备数据(5,15)的至少一部分发送到外部存储器设备(7,17),并从外部存储器设备(7,17)读取设备数据(5,15)并存储 在恢复模式下读取数据存储器(4,14)中的设备数据(5,15)。 本发明还提供了用于这种测量装置(1,11)的相应方法。

    COMPUTERIZED MECHANISM FOR VULNERABILITY EVALUATION IN LAYOUT HAVING INTERCEPTORS
    7.
    发明公开

    公开(公告)号:EP3163491A1

    公开(公告)日:2017-05-03

    申请号:EP16188213

    申请日:2016-09-09

    发明人: TEPER VALERY

    摘要: There is provided a computerized mechanism for vulnerability evaluation in a layout having circuitry units as interceptors, comprising receiving a layout with interceptors incorporated therein at prearranged positions, virtually inducing faults in the layout by modeling a physical phenomenon that affects timings in the layout, detecting timing violations in the layout responsive to the induced faults based on discrepancies between the timings and provided specifications thereof determining vulnerability of the layout to faults according to detected faults, and wherein the method is performed on an at least one computerized apparatus configured to perform the method.

    摘要翻译: 提供了一种用于具有作为拦截器的电路单元的布局中的漏洞评估的计算机化机制,包括以预定位置接收具有并入其中的拦截器的布局,通过对影响布局中的定时的物理现象进行建模来实际地引起布局中的故障, 根据检测到的故障,基于定时与其提供的规格之间的差异来响应于引起的故障的布局中的违规,并且根据检测到的故障确定布局与故障的脆弱性,并且其中,所述方法在被配置为执行该方法的至少一个计算机化设备上执行。

    Method and system for tracing and processing smart card interactive data
    8.
    发明公开
    Method and system for tracing and processing smart card interactive data 审中-公开
    Verfahren und System zur Verfolgung und Verarbeitung interaktiver Chipkartendaten

    公开(公告)号:EP2811308A1

    公开(公告)日:2014-12-10

    申请号:EP14170824.8

    申请日:2014-06-02

    摘要: The invention provides a method for tracing and processing smart card interactive data comprising the following steps: S1. monitoring and collecting original interactive data of respective contacts VCC/IO/RST/CLK of smart card; S2. parsing the original data into smart card communication protocol byte stream; S3. organizing the communication protocol byte stream into communication protocol data sequence; S4. displaying the protocol data sequence to users of system; S5. saving the communication protocol data sequence; S6. converting he communication protocol data sequence into smart card instruction sequence; S7. performing the smart card instruction sequence, rapidly testing cards of the same category and then terminating current tracing. Between the S1 and the termination of current tracing, there are further comprised the following two simultaneously performed tasks: Sm. plotting waveform diagram of smart card interactive data based on the original interactive data and displaying it; Sn. incrementally saving the original interactive data. The invention may achieve the aim of completely recreating field test to better analyze and solve problems.

    摘要翻译: 本发明提供了一种跟踪和处理智能卡交互数据的方法,包括以下步骤:S1。 监控和收集智能卡VCC / IO / RST / CLK各自接口的原始交互数据; S2。 将原始数据解析成智能卡通信协议字节流; S3。 将通信协议字节流组织成通信协议数据序列; S4。 向系统用户显示协议数据序列; S5。 保存通信协议数据序列; S6。 将其通信协议数据序列转换为智能卡指令序列; S7。 执行智能卡指令序列,快速测试相同类别的卡,然后终止当前跟踪。 在S1和当前跟踪的终止之间,还包括以下两个同时执行的任务:Sm。 基于原始交互式数据绘制智能卡交互式数据波形图并进行显示; 锡。 逐步保存原始的交互式数据。 本发明可以实现完全重现现场测试以更好地分析和解决问题的目的。

    MONITORING RELIABILITY OF A DIGITAL SYSTEM
    9.
    发明授权
    MONITORING RELIABILITY OF A DIGITAL SYSTEM 有权
    监测的数字的系统的可靠性

    公开(公告)号:EP2150827B1

    公开(公告)日:2011-03-09

    申请号:EP08736066.5

    申请日:2008-04-10

    IPC分类号: G01R31/317 G01R31/3193

    CPC分类号: G01R31/31937 G01R31/31725

    摘要: System and method are provided for continually monitoring reliability, or aging, of a digital system and for issuing a warning signal if digital system operation degrades past a specified threshold. The technique includes implementing a ring oscillator sensor in association with the digital system, wherein logic and/or device percent composition of the ring oscillator sensor mirrors percent composition thereof within the digital system. Counter logic is coupled to the ring oscillator sensor for converting outputted count signals to an oscillation frequency, and control logic is coupled to the counter logic for periodically evaluating oscillation frequency of the ring oscillator sensor and generating a warning signal indicative of reliability degradation if at least one of: (i) a measured or estimated oscillation frequency is below a warning threshold frequency; or (ii) a measured or estimated rate of change in a difference between measured oscillation frequencies exceeds an acceptable rate of change threshold.

    Vorrichtung und Verfahren zum Prüfen eines Chips, auf dem ein kryptographisches Verfahren implementiert ist
    10.
    发明公开
    Vorrichtung und Verfahren zum Prüfen eines Chips, auf dem ein kryptographisches Verfahren implementiert ist 审中-公开
    装置和方法,用于测试其上实现的密码方法的芯片

    公开(公告)号:EP2278752A1

    公开(公告)日:2011-01-26

    申请号:EP10160598.8

    申请日:2010-04-21

    IPC分类号: H04L9/30 G01R31/3193

    摘要: Die vorliegende Erfindung betrifft das Prüfen eines Chips, auf dem ein kryptographisches Verfahren implementiert ist. Dabei wird ein erstes Ergebnis bestimmt durch: ein erstes Ausführen der Basisfunktion unter Verwendung einer ersten Zahl als Parameter der Basisfunktion; und ein zweites Ausführen der Basisfunktion unter Verwendung einer zweiten Zahl als Parameter der Basisfunktion, wobei die erste und die zweite Zahl Zufallszahlen sind. Ein zweites Ergebnis wird bestimmt durch: Bestimmen einer dritten Zahl durch Ausführen einer mathematischen Operation, bei der die erste und die zweite Zahl Operanden der mathematischen Operation sind; und ein drittes Ausführen der Basisfunktion unter Verwendung der dritten Zahl als Parameter der Basisfunktion. Der Chip wird als fehlerfrei angezeigt, wenn das erste und das zweite Ergebnis gleich sind. Die vorliegende Erfindung ist dort anwendbar, wo ein sicheres Handhaben von Daten gewünscht ist. Sie ermöglicht ein zuverlässiges Testen von Chips, auf denen kryptographische Verfahren implementiert sind.

    摘要翻译: 所述装置(11)具有由所述加密方法的基础功能的执行通过使用一个数字,作为基函数的参数被配置成确定矿的结果的计算模块(111),在所有。 另一个计算模块(112)是由确定性采矿通过进行数学运算被配置成确定矿另一结果的第三数目。 因此独立权利要求中包括了以下内容:(1)用于测试芯片的方法; (2)与编码的数据介质的计算机程序产品; 和(3)与设备的系统。