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    LIGHT SOURCE MODULE
    5.
    发明公开
    LIGHT SOURCE MODULE 审中-公开

    公开(公告)号：EP3783260A1

    公开(公告)日：2021-02-24

    申请号：EP19789247.4

    申请日：2019-04-18

    申请人： NICHIA CORPORATION

    发明人： OKAHISA, Tsuyoshi

    IPC分类号： F21V5/04 ,  F21V5/00 ,  G02B3/02 ,  H01L33/58 ,  H01L33/60 ,  F21Y115/10

    摘要： A light source module includes: a light source having an upper surface comprising a light emission surface; and a light-guide member comprising a lens portion having a rotation axis. The lens portion includes: a concave incidence surface facing the light emission surface of the light source; a reflection surface disposed outside the incidence surface, the reflection surface being configured to reflect part of light entering through the incidence surface, and being inclined at an angle of 45 degrees or more from a direction horizontal to the rotation axis; and exit surface. The incidence surface includes: a first incidence area having four-fold symmetry about the rotation axis and having a curved concave shape in a cross section containing the rotation axis; and a second incidence area having a curved convex shape in a cross section rotated 45 degrees from the first incidence area and containing the rotation axis.

    IMPROVEMENTS RELATING TO PARTICLE CHARACTERISATION
    9.
    发明授权
    IMPROVEMENTS RELATING TO PARTICLE CHARACTERISATION 有权
    与粒子表征有关的改进

    公开(公告)号：EP3066452B1

    公开(公告)日：2018-04-04

    申请号：EP14798924.8

    申请日：2014-11-04

    申请人： Malvern Panalytical Limited

    发明人： SPRIGGS, David

    IPC分类号： G01N21/51 ,  G02B3/02 ,  G01N21/47 ,  G01N15/02 ,  G01N15/14

    CPC分类号： G01N15/0205 ,  G01N15/0211 ,  G01N15/1456 ,  G01N21/51 ,  G01N2021/4707 ,  G01N2021/4709 ,  G01N2021/4711 ,  G02B3/02

    摘要： A particle characterisation apparatus is disclosed comprising: a light source; a sample cell; a collecting lens and a detector. The light source is operable to illuminate a sample comprising dispersed particles within the sample cell with a light beam along a light beam axis. The light beam axis passes through a first wall of the sample cell, through the sample, and through a second wall of the sample cell, so as to produce scattered light by interactions with the sample. The detector is configured to detect light scattered from the sample. The second wall of the sample cell comprises a lens with a convex external surface through which the light beam axis passes. The collecting lens is arranged to collect and focus scattered light leaving the sample cell onto the detector, and comprises an aspheric surface.