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    DYNAMIC IMAGING SYSTEM WORKFLOW OPTIMIZATION
    6.
    发明公开
    DYNAMIC IMAGING SYSTEM WORKFLOW OPTIMIZATION 审中-公开

    公开(公告)号：EP4201332A1

    公开(公告)日：2023-06-28

    申请号：EP22151508.3

    申请日：2022-01-14

    申请人： Koninklijke Philips N.V.

    发明人： VOGTMEIER, Gereon ,  VAN BEERS, Paulus René Maria ,  MSR, Dikshit

    IPC分类号： A61B6/00 ,  H01J35/12 ,  H05G1/02 ,  H05G1/26 ,  H05G1/36 ,  H05G1/54

    摘要： The present invention relates to X-ray imaging. In order to improve the throughout of an X-ray imaging system, an apparatus is provided for managing an imaging workflow of an X-ray imaging system for an upcoming imaging sequence. The apparatus comprises an input unit, a processing unit, and an output unit. The input unit is configured to receive data including (i) a current temperature profile of an X-ray anode inside a tube housing of the X-ray imaging system, (ii) information about a heat capability and a cooling rate of the X-ray anode, (iii) information about a heat capability and a cooling rate of the tube housing, (iv) information about a current operation condition of the X-ray imaging system, and (v) information about a planned operation condition of the X-ray imaging system for the upcoming imaging sequence, wherein the planned operation condition comprises a sequence of planned scans, each planned scan being associated with a respective set of planned scan parameters. The processing unit is configured to determine, based on the received data, an estimated temperature profile of the X-ray anode under the planned operation condition for the upcoming imaging sequence. The processing unit is configured to compare the estimated temperature profile of the X-ray anode with a maximum allowable hardware temperature of the X-ray anode. In response to the determination that the estimated temperature profile is greater than or equal to the maximum allowable hardware temperature of the X-ray anode, the processing unit is configured to modify the planned operation condition such that the estimated temperature profile of the X-ray anode under the modified planned operation condition is less than the maximum allowable hardware temperature of the X-ray anode. The modified planned operation condition comprises a change of the sequence of planned scans and/or a change of the set of planned scan parameters for one or more planned scans. The output unit is configured to provide the modified planned operation condition for the upcoming imaging sequence.

    X-RAY GENERATOR AND X-RAY IMAGING DEVICE
    9.
    发明公开
    X-RAY GENERATOR AND X-RAY IMAGING DEVICE 审中-公开

    公开(公告)号：EP4006950A1

    公开(公告)日：2022-06-01

    申请号：EP19944554.5

    申请日：2019-09-03

    申请人： Canon Anelva Corporation

    发明人： KAWASE, Junya

    IPC分类号： H01J35/16 ,  H05G1/02

    摘要： An X-ray generation apparatus includes an X-ray generation unit, a storage container configured to store the X-ray generation unit, and an insulating component arranged between an inner surface of the storage container and at least a part of the X-ray generation unit. The insulating component includes a first insulating member and a second insulating member, the first insulating member includes a first portion having a first surface, and a second portion having a second surface, a step difference is formed by the first surface and the second surface, and the second portion has a thickness smaller than that of the first portion, an adhesive surface of the second insulating member and the second surface of the first insulating member are connected by an adhesive material, and a flatness of the second surface is better than a flatness of the first surface.