31.
    实用新型
    失效

    公开(公告)号:JPS61125729U

    公开(公告)日:1986-08-07

    申请号:JP804485

    申请日:1985-01-25

    SPECTROPHOTOMETER
    32.
    发明专利

    公开(公告)号:JPS60262029A

    公开(公告)日:1985-12-25

    申请号:JP11891884

    申请日:1984-06-08

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To enhance an S/N ratio, by a method wherein rays of light having different wavelengths are guided to a reference specimen and a specimen to be measured and, thereafter, a pair of luminous fluxes of both specimens comprising same wavelength lights are again separated to be guided to different detector to obtain the permeability of the specimen to be measured and two-luminous- flux two-wavelength signals. CONSTITUTION:Rays of light from light sofurces 1, 2 for first and second wavelength lights are incident on a luminous flux splitting means 5 through first and second spectroscopes 3, 4 to be splitted while split rays are reorganized by a luminous flux reorganization means 8 through reference specimen and measuring specimen chambers 6, 7 while first and second wavelength luminous fluxes passed through reference and measuring specimen light paths R, S are allowed to be incident on first and second light detectors 9, 10. The signals of the detectors 9, 10 are allowed to be incident on a divider 20 through first and second dividers 11, 12 and the ratio of measuring and reference specimen light signals is calculated with respect to the first wavelength light by the first divider 1 and the same ratio is also calculated with respect to the second wavelength light by the divider 12 and the ratio of both of them is calculated by the divider 20.

    SPECTROPHOTOMETER
    33.
    发明专利

    公开(公告)号:JPS60142219A

    公开(公告)日:1985-07-27

    申请号:JP24749783

    申请日:1983-12-29

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To obtain an even base line by dividing luminous flux having different two wavelengths into four luminous flux of control light and sample light to introduce them to a control sample and a reference sample, and adopting the ratio of a signal ratio of the sample light to the control light in terms of one wavelength light to the ratio in terms of another wavelength light. CONSTITUTION:White light emitted from a light source 1 is diffracted to the light having different two wavelengths by spectroscopes 2, 3. Said light are introduced to the same position of two luminous flux dividing mechanism 4, divided respectively into two luminous flux, and said flux are absorbed by the control sample 5 and a sample 6 to be measured respectively and introduced to a detector 7. A signal discriminating circuit 8 discriminates signals S1 and R1 of the sample and reference light in terms of one wavelength light, and signals S2 and R2 of the sample and reference lights in terms of another wavelength light. These signals are subjected to calculation of (S1/R1)/(S2/R2) by a processor 9, and the result is displayed on a display device 10. In this way, the base line is evened and the light source brightness variation is corrected.

    Spectroscope for two wavelengths
    35.
    发明专利
    Spectroscope for two wavelengths 失效
    两波长的光谱

    公开(公告)号:JPS59159030A

    公开(公告)日:1984-09-08

    申请号:JP3362383

    申请日:1983-02-28

    Applicant: Shimadzu Corp

    CPC classification number: G01N21/314 G01J3/427

    Abstract: PURPOSE:To make it possible to separate two wavelengths by one device, by using one common input slit for two diffraction gratings, which are independently rotated on the same axis, a collimator mirror, two telemeter mirrors corresponding to the two diffraction gratings, and two output slits. CONSTITUTION:Diffraction gratings G1 and G2 are independently rotated with a common axis X as a center. Light is inputted from an input slit S1. The light, which is inputted from the input slit S1, is made to be parallel flux by a collimator mirror M1. The light is inputted to the diffraction gratings G1 and G2. The light with one wavelength of the light inputted in the diffraction gratings G1 is reflected and diffracted and inputted to a telemeter mirror M2. The light is reflected by the M2, converged into an output slit S2, and inputted to a light detector PM1. The light with another wavelength of the light inputted to the diffraction grating G2 from the collimator mirror M1 is diffracted and inputted into a telemeter mirror M3. The light is reflected by the M3, converged into an output slit 3, and inputted to a light detector PM2.

    Abstract translation: 目的:为了能够通过一个器件分离两个波长,通过使用一个共同的输入狭缝,两个衍射光栅独立地旋转在相同的轴上,准直镜,两个遥测镜对应于两个衍射光栅,两个 输出狭缝。 构成:衍射光栅G1和G2以公共轴X为中心独立旋转。 从输入狭缝S1输入光。 从输入狭缝S1输入的光由准直镜M1构成为平行磁通。 光被输入到衍射光栅G1和G2。 在衍射光栅G1中输入的光的一个波长的光被反射和衍射并输入到远程计镜M2。 光被M2反射,收敛到输出狭缝S2中,并输入到光检测器PM1。 从准直仪反射镜M1输入到衍射光栅G2的光的另一波长的光被衍射并输入到远程计镜M3中。 光被M3反射,会聚到输出狭缝3中,并被输入到光检测器PM2。

    COLOR RENDERING PROPERTY CONTROL DEVICE FOR HIGH PRESSURE SODIUM VAPOR LAMP

    公开(公告)号:JPS58161833A

    公开(公告)日:1983-09-26

    申请号:JP4494682

    申请日:1982-03-19

    Abstract: PURPOSE:To judge simply color rendering property of a high pressure sodium vapor lamp by obtaining the ratio of luminescence energies in two wave length areas of the light from a lamp. CONSTITUTION:The light from a sodium vapor lamp 9 is directed to a photoelectric transducer elements 3 and 4 through filters 1 and 2 which have a transmission band with wave lengths 590nm and 570nm with a half value width of 5nm as centers. The outputs I1 and I2 are inputted to a divider 5 to calculate I2/ I1. Its output I2/I1 is compared with a reference voltage V0 from a reference voltage generator 7 by means of a comparator 6. If it exceeds X0, a display element 8 is turned ON, and the color rendering property is easily judged.

    DENSITOMETER
    37.
    发明专利

    公开(公告)号:JPS58115345A

    公开(公告)日:1983-07-09

    申请号:JP21152881

    申请日:1981-12-29

    Applicant: SHIMADZU CORP

    Inventor: YAMAMOTO HIROSHI

    Abstract: PURPOSE:To arrange detectors closely at a fixed distance to increase selectivity of an sample to be analysed by arranging the detectors on a spectrum image surface obtained by a spectral element to be dislo in the spectral directions in different degrees of spectra. CONSTITUTION:The solid-state image dectors 9lambda1, 9lambda2 are arranged so as to dislocate the wavelength dispersing directions within the photodetecting surfaces of positive primary spectrum S+1 and negative primary spectrum S-1 respectively. When wavelength lambda1 or lambda2 is to be changed, the detector 9lambda1 or 9lambda2 is dislocated in the wavelength dispersing direction within said respective spectra. Since two detectors are arranged so as to be displaced in the spectral directions within the different degrees of spectra on the spectrum image surface in this invention, the selectivity of an analying sample is extended independently of the interval between two wavelengths to be approached.

    TWO WAVELENGTH MULTI-ITEM SPECTROSCOPIC ANALYZING APPARATUS

    公开(公告)号:JPS5858440A

    公开(公告)日:1983-04-07

    申请号:JP15660981

    申请日:1981-09-30

    Applicant: SHIMADZU CORP

    Inventor: IWAHASHI KENJI

    Abstract: PURPOSE:To fetch out alternately two wavelength light necessary for a two wavelength multi-item spectroscopic analyzing apparatus in a good SN ratio with a simple construction, by introducting the light from the spectrum face and using a spectroscope in an opposite direction. CONSTITUTION:Desired two wavelength light is outputted alternatively and selectively by a wavelength selective plate 11 provided on the spectrum face of a spectroscope and an image is formed on a SELFOC lens or an optical fiber 13 being situated in a conjugate position to the plate 11 through a camera mirror 8, a grating 10, a collimator mirror 9 and a slit 12 and then, said image is made incident to a flow cell 14 of every analyzing item. The desired two wavelength light necessary for two wavelength multi-item spectroscopic analysis is fetched out alternately in a good S/N ratio by a simple construction eliminating the need for a respective optical element such as interference filters etc. of this wavelength light.

    Photometric device using more than one wavelength
    39.
    发明专利
    Photometric device using more than one wavelength 失效
    光学设备使用超过一个波长

    公开(公告)号:JPS5753644A

    公开(公告)日:1982-03-30

    申请号:JP12887780

    申请日:1980-09-17

    CPC classification number: G01N21/255

    Abstract: PURPOSE:To improve precision by eliminating the effect of temperature fluctuations of interference filters upon a measurement result, by irradiating all interference filters with light from a light source all the time and by guiding light passed through a specific filter to a sample. CONSTITUTION:Light guides 22 are provided as many as interference filters 24, which are irradiated with light from a light source 21 all the time. A rotary member 25 is turned under an interference filter holding member 23 fixed in position to guide light passed through a prescribed interference filter 24 to a prism 29 through a light guide 28, and the luminous flux is changed in direction to a prescribed phodometric position to irradiate a reaction pipe 35, containing a sample liquid 34, with the luminous flux; and the light passed through the reaction pipe 35 is photodetected by a photodetector 36 and converted photoelectrically to measure the light absorbance of the sample liquid 34. Each interference filter 24 never changes in characteristics at the beginning of photometric operation, so accurate data is obtained.

    Abstract translation: 目的:通过消除干扰滤波器的温度波动对测量结果的影响,通过一直从光源照射所有干涉滤光片,并将通过特定滤光片的光引导到样品,来提高精度。 构成:导光体22与干涉滤光器24一样多,这些干涉滤光器24一直被来自光源21的光照射。 旋转构件25在固定在位置的干涉滤光器保持构件23的下方转动,以将通过规定的干涉滤光器24的光引导到通过导光体28的棱镜29,并且光束在方向上改变为规定的方位位置, 照射含​​有样品液体34的反应管35与光束; 并且通过反应管35的光被光电检测器36光电检测,并进行光电转换,以测量样品液体34的吸光度。每个干涉滤光器24在光度测量操作开始时从不改变特性,因此获得准确的数据。

Patent Agency Ranking