公开(公告)号：US20110138109A1

公开(公告)日：2011-06-09

申请号：US12720676

申请日：2010-03-10

Applicant: Chao-Yin Liu ,  Ming-Cheng Chen ,  Sheng-Hsuan Wang

Inventor： Chao-Yin Liu ,  Ming-Cheng Chen ,  Sheng-Hsuan Wang

IPC: G06F12/00 ,  G06F12/02

CPC classification number: G06F12/0246 ,  G06F2212/7211

Abstract: A method for Wear-Leveling includes: utilizing a comparison circuit to compare an average erase count with an erase count of a first data block; and utilizing a first free block as a replacement for storing data content of the first data block so as to make the first data block become a free block when the erase count of the first data block is smaller than the average erase count.

Abstract translation: 磨损平衡的方法包括：利用比较电路将平均擦除次数与第一数据块的擦除次数进行比较; 并且利用第一空闲块作为第一数据块的数据内容的替换，以便当第一数据块的擦除计数小于平均擦除次数时使第一数据块变为空闲块。

公开(公告)号：US20100262764A1

公开(公告)日：2010-10-14

申请号：US12641330

申请日：2009-12-18

Applicant: Chao-Yin Liu ,  Sheng-Hsuan Wang

Inventor： Chao-Yin Liu ,  Sheng-Hsuan Wang

IPC: G06F12/00

CPC classification number: G06F12/0246 ,  G06F2212/7201 ,  G06F2212/7202 ,  G06F2212/7205

Abstract: A storage apparatus includes a first storage unit and at least a second storage unit. A method for accessing the storage apparatus generates a plurality of bad block lists regarding the plurality of the storage units, respectively, and according to at least one bad block indicated by a bad block list of the first storage unit, configures at least a good block in each second storage unit corresponding to the at least one bad block of the first storage unit as a replacement block of each second storage unit. Accordingly, the method generates a mapping result of each second storage unit according to a bad block list of the second storage unit and each replacement block, and accesses the storage apparatus according to the bad block list of the first storage unit and each mapping result.

Abstract translation: 存储装置包括第一存储单元和至少第二存储单元。 访问存储装置的方法分别生成关于多个存储单元的多个不良块列表，并且根据由第一存储单元的坏块列表指示的至少一个坏块，至少配置好块 在每个第二存储单元中，对应于第一存储单元的至少一个坏块作为每个第二存储单元的替换块。 因此，该方法根据第二存储单元和每个替换块的坏块列表生成每个第二存储单元的映射结果，并且根据第一存储单元的坏块列表和每个映射结果访问存储装置。