公开(公告)号：US20130229594A1

公开(公告)日：2013-09-05

申请号：US13866413

申请日：2013-04-19

Applicant: APPLE INC.

Inventor： Moo Kyung Son ,  Victor Han-En Yin ,  John Z. Zhong ,  Wei Chen

IPC: G02F1/1335

CPC classification number: G02F1/133606 ,  G02F1/1309

Abstract: A method for testing photosensitivity of an electronic display module, such as a liquid crystal display module, is provided. In one embodiment, a method includes exposing a display module to light at a first intensity and measuring an amount of light transmitted through the display module. The method may also include exposing the display module to light at a second intensity and measuring an amount of that light transmitted through the display module. The measured amounts may then be compared to determine an optical property, such as photosensitivity, of the display panel. Various other methods, systems, and manufactures are also disclosed.

Abstract translation: 提供了一种用于测试诸如液晶显示模块的电子显示模块的光敏性的方法。 在一个实施例中，一种方法包括将显示模块以第一强度曝光并测量透过显示模块的光量。 该方法还可以包括将显示模块暴露于第二强度的光并测量透过显示模块的光量。 然后可以比较所测量的量以确定显示面板的光学性质，例如光敏性。 还公开了各种其它方法，系统和制造。