公开(公告)号：US20250029226A1

公开(公告)日：2025-01-23

申请号：US18908531

申请日：2024-10-07

Applicant: Adobe Inc.

Inventor： Akhilesh KUMAR ,  Zhe Lin ,  William Lawrence Marino

IPC: G06T7/00 ,  G06N3/08 ,  G06N5/04

Abstract: Models for classifying exposure defects in images are provided by training a binary model on a dataset of images labeled to indicate exposure within the images. When trained, the binary model classifies an image based on whether the image includes an exposure defect. A classification model is also trained. The classification model is trained on a dataset of images having exposure defects labeled to indicate exposure scores or exposure defect classifications. When trained, the classification model classifies the image based on a level of exposure. The binary model and the classification model can be stored for identifying and classifying exposure defects within images.