公开(公告)号：US10929261B1

公开(公告)日：2021-02-23

申请号：US16017736

申请日：2018-06-25

Applicant: Amazon Technologies, Inc.

Inventor： Alex Levin ,  Ziv Harel ,  Evgeny Khanin ,  David Ben-Dror ,  Georgy Machulsky ,  Daniel Elkaslassy ,  Sergei Shtern

IPC: G06F11/26 ,  G06Q30/00 ,  H04L29/08

Abstract: A technology is described for a device diagnosis station. The device diagnosis station may be configured to identify an electronic device physically connected to the device diagnosis station, evaluate an operational state of the electronic device by executing testing instructions configured to test the functionality of the electronic device and collect operational state information for the electronic device. The device diagnosis station may be configured to determine the operational state of the electronic device and execute recovery instructions to restore the electronic device to an improved state when a recoverable error is detected. The device diagnosis station may be configured to initiate a device return procedure for the electronic device when a non-recoverable error state is detected.