公开(公告)号：US20170211936A1

公开(公告)日：2017-07-27

申请号：US15416768

申请日：2017-01-26

Applicant: Apple Inc.

Inventor： Adam HOWELL ,  Hung A. PHAM ,  Xiaoyuan TU

IPC: G01C17/38 ,  G01C17/02

CPC classification number: G01C17/38 ,  G01C17/02

Abstract: A method for performing continuous calibration of a magnetometer in a device includes during operation of a device, continually performing magnetometer measurements; continuously determining a state of the device; determining a magnetometer calibration model based on the magnetometer measurements and the state of the device; continually evaluating an accuracy of the magnetometer calibration model based the magnetometer measurements and the state of the device; and updating the magnetometer calibration model based on the evaluation of the accuracy magnetometer calibration model, the magnetometer measurements, and the state of the device.