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公开(公告)号：US20230082676A1
公开(公告)日：2023-03-16
申请号：US17820857
申请日：2022-08-18
Applicant: Apple Inc.
Inventor： Rajeev VERMA , Stanley M. MAYALIL , Cole M. STEWART , Jae Oh CHUNG , Li LI
Abstract: The described embodiments set forth techniques for testing a wireless device configured to use an embedded Universal Integrated Circuit Card (eUICC) and excluding a removable UICC card. A test apparatus processes application protocol data units (APDUs) for conformance with a standardized test specification, where the APDUs are provided by an eSIM command handler client application that interfaces with a baseband processor in communication with the eUICC that includes test profiles with test applets.
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