公开(公告)号：US20190137337A1

公开(公告)日：2019-05-09

申请号：US16095323

申请日：2017-04-13

Applicant: Apple Inc.

Inventor： Trent D. RIDDER ,  Mark Alan ARBORE ,  Gary SHAMBAT ,  Robert CHEN ,  David I. SIMON ,  Miikka M. KANGAS

IPC: G01J3/427 ,  G01J3/28 ,  G01J3/10 ,  G01N21/35

Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.

公开(公告)号：US20190128734A1

公开(公告)日：2019-05-02

申请号：US16095311

申请日：2017-04-13

Applicant: Apple Inc.

Inventor： Mark Alan ARBORE ,  Gary SHAMBAT ,  Matthew A. TERREL

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/36 ,  G01J3/42 ,  G01N21/25

Abstract: Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultanous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.