公开(公告)号：US09372228B2

公开(公告)日：2016-06-21

申请号：US14500418

申请日：2014-09-29

Applicant: Apple Inc.

Inventor： Joshua G. Nickel ,  Jonathan P. G. Gavin

IPC: G01R31/302 ,  G01R31/265

CPC classification number: G01R31/3025 ,  G01R31/265

Abstract: Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.

Abstract translation: 可以使用非接触测试系统来测试诸如包含天线，连接器，焊缝，电子器件部件，导电壳体结构和其它结构的结构的电子器件结构。 测试系统可以包括矢量网络分析器或其它测试单元，其产生频率范围内的射频测试信号。 射频测试信号可以使用具有一个或多个测试天线的天线探针发射到被测电子设备结构。 天线探头可以接收相应的射频信号。 可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。