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公开(公告)号:US11112312B2
公开(公告)日:2021-09-07
申请号:US16451958
申请日:2019-06-25
Applicant: Datacolor, Inc.
Inventor: Nilesh B. Dhote , Taeyoung Park
Abstract: A method includes determining a fielded color measurement instrument is not calibrated to measure light emitted by a fielded light emitting device, assembling a calibration matrix, such that a product of the calibration matrix multiplied by a response of the fielded color measurement instrument to the light emitted by the fielded light emitting device is a triplet that corresponds to a Commission Internationale de L'éclairage XYZ color space, wherein the calibration matrix contains measurements made by the fielded color measurement instrument of a first plurality of lights emitted by the fielded light emitting device and measurements made by a spectroradiometer of a second plurality of lights emitted by a reference light emitting device of a same make and model as the fielded light emitting device, wherein the spectroradiometer is located remotely from the fielded color measurement instrument, and storing the calibration matrix on the fielded color measurement instrument.
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公开(公告)号:US20240085323A1
公开(公告)日:2024-03-14
申请号:US17931895
申请日:2022-09-13
Applicant: Datacolor, Inc.
Inventor: Zhiling Xu , Nilesh B. Dhote , David Williams , Seaver Li , William Binder , Venkata R. Thumu
CPC classification number: G01N21/57 , G01N21/251 , G01N2201/062 , G01N2201/127
Abstract: In one example, a method includes controlling a gloss channel of a color measurement apparatus to measure a surface gloss of a color sample to generate a gloss value for the color sample, controlling a color channel of the color measurement apparatus to measure a reflectance spectrum of the color sample to generate a first plurality of reflectance values for the color sample under a first measurement geometry, and converting the first plurality of reflectance values to a second plurality of reflectance values representing the reflectance spectrum of the color sample under a second measurement geometry, different from the first measurement geometry, wherein the converting utilizes an adjustment that is a function of the gloss value.
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