公开(公告)号：US10234409B2

公开(公告)日：2019-03-19

申请号：US15265798

申请日：2016-09-14

Applicant: DunAn Microstaq, Inc.

Inventor： Arvind Rao ,  Chen Yang ,  Jennifer O'Keefe ,  Buu Chung

IPC: F25B49/02 ,  G01N25/00 ,  G01M99/00

Abstract: A test equipment arrangement includes a superheat controller configured for connection to a unit under test, and further configured to test at least one operational parameter of the unit under test.

公开(公告)号：US20170082336A1

公开(公告)日：2017-03-23

申请号：US15265798

申请日：2016-09-14

Applicant: DunAn Microstaq, Inc.

Inventor： Arvind Rao ,  Chen Yang ,  Jennifer O'Keefe ,  Buu Chung

IPC: F25B49/02 ,  G01N25/00

CPC classification number: G01N25/00 ,  G01M99/008

Abstract: A test equipment arrangement includes a superheat controller configured for connection to a unit under test, and further configured to test at least one operational parameter of the unit under test.