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公开(公告)号:US20240286217A1
公开(公告)日:2024-08-29
申请号:US18570791
申请日:2022-06-14
Applicant: ELECTRO SCIENTIFIC INDUSTRIES, INC.
CPC classification number: B23K26/06 , B23K26/705 , G01J1/42 , G02F1/292 , G02F1/33 , G01J2001/4247 , G02F2203/24
Abstract: Numerous embodiments of a laser-processing apparatus are disclosed. In one embodiment, the laser-processing apparatus includes a laser source operative to generate a beam of laser energy, an acousto-optic deflector (AOD) arranged within a beam path, a controller coupled to the AOD, and a beam analysis system operative to measure characteristics of the beam, generate measurement data representative of the measured beam characteristics, and transmit the measurement data to a controller operative to control the operation of the AOD based on that measurement data. In another embodiment, the laser-processing apparatus includes a system for characterization of cross-axis wobble of a galvanometer mirror, comprising a reference laser source configured to emit a reference laser beam, a reflective surface formed on the galvanometer mirror and configured to reflect the reference laser beam to a sensor configured to output a signal representative of the position of the reference beam to a controller.