公开(公告)号：US20160232075A1

公开(公告)日：2016-08-11

申请号：US14989082

申请日：2016-01-06

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Kwang Yong LEE ,  Jung Hwan LEE

IPC: G06F11/36

CPC classification number: G06F11/008

Abstract: Disclosed is an apparatus and method for measuring system availability for system development. The method of measuring availability of a system includes: generating an error in the system and detecting a fault to measure a Mean Time To Repair (MTTR); and measuring the availability of the system by using the measured MTTR.

Abstract translation: 公开了一种用于测量系统开发的系统可用性的装置和方法。 测量系统可用性的方法包括：在系统中产生错误并检测故障以测量平均修复时间（MTTR）; 并使用测量的MTTR测量系统的可用性。