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公开(公告)号:US20190088393A1
公开(公告)日:2019-03-21
申请号:US16075269
申请日:2017-02-02
Applicant: ETP ION DETECT PTY LTD
Inventor: Richard STRESAU , Kevin Hunter , Yair Benari , Russell Jurek , Toby Shanley
Abstract: An apparatus for providing a magnetic field includes a magnet having a surface, and a structure disposed above the magnet surface. The structure includes a material of high magnetic permeability. The apparatus provides an interface between the material of high magnetic permeability and a material of low magnetic permeability. The apparatus may have two poles in magnetic communication with the magnet, the poles extending above the surface of the magnet, and the structure is disposed between the poles. The structure may have alternating regions of high magnetic permeability and low magnetic permeability. The apparatus alters the magnetic field of the magnet to reduce or remove a disorder in the magnetic field, and/or decrease the magnitude of the magnetic field, and/or induce a distortion in the magnetic field, and/or align or re-align the magnetic field, and/or orientate or re-orientate the magnetic field, and/or alter distribution or shape of the magnetic field.
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公开(公告)号:US20190259590A1
公开(公告)日:2019-08-22
申请号:US16308193
申请日:2017-06-08
Applicant: ETP ION DETECT PTY LTD
Inventor: Wayne Sheils , Kevin Hunter
Abstract: An apparatus for amplifying an electron signal caused by the impact of a particle with an electron emissive surface. The apparatus includes: a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons, a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces. The bias voltage(s) is sufficient to form the amplified electron signal. The apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s). The apparatus may be used as part of detector in a mass spectrometer, for example.
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