公开(公告)号：US20220244293A1

公开(公告)日：2022-08-04

申请号：US17648876

申请日：2022-01-25

Applicant: EXFO Inc.

Inventor： Dominic LAPIERRE ,  Martin LEVESQUE ,  Jean-Pierre COUDERT

IPC: G01R13/02

Abstract: In order to improve the analysis of the RF interferences, there is provided a peak selection assistance method for finding a local peak in an RF spectrum trace. The method provides a window on the spectrum trace display, which can be configured and/or moved by a user from user interaction on said user interface. When the window is defined, the method finds the highest peak within the window and optionally adds a marker on it. The method therefore snaps to the highest peak within the window. This improves the way of precisely detecting the maximum amplitude and the center frequency for any local peak on the spectrum.