公开(公告)号：US20150084644A1

公开(公告)日：2015-03-26

申请号：US14496447

申请日：2014-09-25

Applicant: Electronics and Telecommunications Research Institute

Inventor： Hyuk-Je KIM ,  Jong-Moon LEE ,  Seong-Ho SON ,  Soon-Ik JEON ,  Hyung-Do CHOI

IPC: G01R25/00 ,  G01R23/02 ,  G01N22/00 ,  G01S13/02

CPC classification number: G01R25/00 ,  G01N22/00

Abstract: A phase measurement method in a microwave tomography system may include: transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value;transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.

Abstract translation: 微波断层摄影系统中的相位测量方法可以包括：发送第一Tx频率信号，接收对应于第一Tx频率信号的信号，以及测量第一相位值; 从所述第一Tx频率信号发送由预定离散频率分离的第二Tx频率信号，接收对应于所述第二Tx频率信号的信号，以及测量第二相位值; 基于第一和第二相位值之间的差来计算第一相位差; 基于离散频率计算第二相位差; 以及通过比较所述第一和第二相位差来确定展开的相位值。