公开(公告)号：US20130096866A1

公开(公告)日：2013-04-18

申请号：US13693338

申请日：2012-12-04

Applicant: FORMFACTOR, INC.

Inventor： Todd R. Kemmerling

IPC: G01R31/3183

CPC classification number: G01R31/318307 ,  G06F8/30

Abstract: Methods, apparatus, and computer readable media for designing a custom test system are described. Examples of the invention can relate to a method of generating test system software for a semiconductor test system. In some examples, a method can include obtaining a configuration of the semiconductor test system, the configuration including a description of a device under test (DUT) and a description of test hardware; and generating an application programming interface (API) specific to the configuration of the semiconductor test system, the API being generated based on the description of the DUT and the description of the test hardware, the API providing a programming interface between the test system software and the test hardware to facilitate testing of the DUT.