-
公开(公告)号：US20230408252A1
公开(公告)日：2023-12-21
申请号：US18250032
申请日：2021-11-16
发明人： Parag Prakash Wagaj , Ethan James Shepherd , Michael R. Tanner , Edward J. Damron , Douglas Charles Beerck
IPC分类号： G01B11/24 , G01B11/00 , G01M13/021 , B23F23/12
CPC分类号： G01B11/2416 , B23F23/12 , G01M13/021 , G01B11/005
摘要： A multi-axis system (30) for positioning a workpiece measuring sensor (54) on a metrology machine. Preferably, each sensor is positionable via a system comprising movement along and/or about at least linear directions/axes (X, Z, A, B) so as to control linear and/or rotational movement of a sensor automatically to a predetermined position without operator intervention. The multi-axis positioning system allows faster setup times when a workpiece or tooling on a machine is changed.
-
公开(公告)号：US11092430B2
公开(公告)日：2021-08-17
申请号：US16329288
申请日：2017-09-06
发明人： Parag P. Wagaj , Ethan James Shepherd , Michael Tanner , Justin Shultz , Ronald E. Mack , Douglas Charles Beerck
摘要： A method and machine whereby utilizing both tactile (46) and non-contact (50) sensors or probes for workpiece (56) inspection and/or measurement results in significant cycle time savings while accuracy is maintained.
-
3.发明申请公开(公告)号：US20200292305A1
公开(公告)日：2020-09-17
申请号：US16651172
申请日：2018-10-23
发明人： Parag Prakash Wagaj , Douglas Charles Beerck , Ethan James Shepherd , Michael R. Tanner , Edward J. Damron , Aaron Timothy Slusser
摘要： A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
-
公开(公告)号：US11262190B2
公开(公告)日：2022-03-01
申请号：US16651172
申请日：2018-10-23
发明人： Parag Prakash Wagaj , Douglas Charles Beerck , Ethan James Shepherd , Michael R. Tanner , Edward J. Damron , Aaron Timothy Slusser
IPC分类号： G01B11/24 , G01B11/00 , G01M13/021
摘要： A method and machine comprising at least one non-contact sensor (52) on a functional testing platform (50) for workpiece inspection and/or measurement. The inclusion of at least one non-contact sensor on the functional testing platform results in the combination of two machine platforms into a single machine and provides the user with measurement characteristics of both methods, functional and analytical, saving significant cycle time and significant space.
-
公开(公告)号：US20190249983A1
公开(公告)日：2019-08-15
申请号：US16329288
申请日：2017-09-06
发明人： Parag P. Wagaj , Ethan James Shepherd , Michael Tanner , Justin Shultz , Ronald E. Mack , Douglas Charles Beerck
CPC分类号： G01B11/2416 , G01B5/008 , G01B5/202
摘要： A method and machine whereby utilizing both tactile (46) and non-contact (50) sensors or probes for workpiece (56) inspection and/or measurement results in significant cycle time savings while accuracy is maintained.
-
-
-
-
搜索结果
5 条记录 (耗时 0.013 秒)
