公开(公告)号：US20220004935A1

公开(公告)日：2022-01-06

申请号：US17481553

申请日：2021-09-22

Applicant: Intel Corporation

Inventor： Barath Lakshmanan ,  Craig Sperry ,  David Austin ,  Nilesh Ahuja

IPC: G06N20/20 ,  G06N7/00 ,  G06N3/04

Abstract: An apparatus to facilitate ensemble learning for deep feature defect detection is disclosed. The apparatus includes one or more processors to receive a deep feature vector from a feature extractor of an ensemble learning system, the deep feature vector extracted from input data; cluster the deep feature vector into a plurality of clusters based on a distance into the plurality of clusters; execute a probabilistic machine learning model corresponding to a cluster of the plurality of clusters to which the deep feature vector is clustered; and detect whether the deep feature vector comprises a defect based on an output of execution of the probabilistic machine learning model.