FUSIBLE INSTRUCTIONS AND LOGIC TO PROVIDE OR-TEST AND AND-TEST FUNCTIONALITY USING MULTIPLE TEST SOURCES
    1.
    发明申请
    FUSIBLE INSTRUCTIONS AND LOGIC TO PROVIDE OR-TEST AND AND-TEST FUNCTIONALITY USING MULTIPLE TEST SOURCES 审中-公开
    使用多个测试源提供可靠的说明和逻辑提供测试和测试功能

    公开(公告)号:US20170052788A1

    公开(公告)日:2017-02-23

    申请号:US15340916

    申请日:2016-11-01

    Abstract: Fusible instructions and logic provide OR-test and AND-test functionality on multiple test sources. Some embodiments include a processor decode stage to decode a test instruction for execution, the instruction specifying first, second and third source data operands, and an operation type. Execution units, responsive to the decoded test instruction, perform one logical operation, according to the specified operation type, between data from the first and second source data operands, and perform a second logical operation between the data from the third source data operand and the result of the first logical operation to set a condition flag. Some embodiments generate the test instruction dynamically by fusing one logical instruction with a prior-art test instruction. Other embodiments generate the test instruction through a just-in-time compiler. Some embodiments also fuse the test instruction with a subsequent conditional branch instruction, and perform a branch according to how the condition flag is set.

    Abstract translation: 易熔指令和逻辑在多个测试源上提供OR测试和与测试功能。 一些实施例包括解码用于执行的测试指令的处理器解码级,指定第一,第二和第三源数据操作数的指令以及操作类型。 执行单元响应于解码的测试指令,根据指定的操作类型在来自第一和第二源数据操作数的数据之间执行一个逻辑操作,并且执行来自第三源数据操作数的数据和 第一个逻辑运算结果设置条件标志。 一些实施例通过将一个逻辑指令与现有技术的测试指令进行融合来动态地产生测试指令。 其他实施例通过即时编译器生成测试指令。 一些实施例还将测试指令与随后的条件分支指令融合,并且根据条件标志的设置来执行分支。

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