-
公开(公告)号：US10802942B2
公开(公告)日：2020-10-13
申请号：US16235959
申请日：2018-12-28
Applicant: Intel Corporation
Inventor： Mats Agerstam , Bahareh Sadeghi , Jason Martin , Jeffrey Ota , Justin Gottschlich , Marcos Carranza , Maria Ramirez Loaiza , Alexander Heinecke , Mohammad Mejbah Ul Alam , Robert Colby , Sara Baghsorkhi , Shengtian Zhou
Abstract: An apparatus includes a data interface to obtain first sensor data from a first sensor and second sensor data from a second sensor of a monitored system; a data analyzer to extract a feature based on analyzing the first and second sensor data using a model, the model trained based on historical sensor data, the model to determine the feature as a deviation between the first and second sensor data to predict a future malfunction of the monitored system; an anomaly detector to detect an anomaly in at least one of the first sensor data or the second sensor data based on the feature, the anomaly corresponding to the future malfunction of the monitored system; and a system applicator to modify operation of the monitored system based on the anomaly.
-
公开(公告)号：US20190138423A1
公开(公告)日：2019-05-09
申请号：US16235959
申请日：2018-12-28
Applicant: Intel Corporation
Inventor： Mats Agerstam , Bahareh Sadeghi , Jason Martin , Jeffrey Ota , Justin Gottschlich , Marcos Carranza , Maria Ramirez Loaiza , Alexander Heinecke , Mohammad Mejbah Ul Alam , Robert Colby , Sara Baghsorkhi , Shengtian Zhou
Abstract: An apparatus includes a data interface to obtain first sensor data from a first sensor and second sensor data from a second sensor of a monitored system; a data analyzer to extract a feature based on analyzing the first and second sensor data using a model, the model trained based on historical sensor data, the model to determine the feature as a deviation between the first and second sensor data to predict a future malfunction of the monitored system; an anomaly detector to detect an anomaly in at least one of the first sensor data or the second sensor data based on the feature, the anomaly corresponding to the future malfunction of the monitored system; and a system applicator to modify operation of the monitored system based on the anomaly.
-
Search Results
2
records
(took 0.014 seconds)
